Teruaki Motooka

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Yamanashi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus of measuring carrier distribution
- Patent number 4,472,633
- Issue date Sep 18, 1984
- Hitachi, Ltd.
- Teruaki Motooka
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring semiconductor characteristics
- Patent number 4,464,627
- Issue date Aug 7, 1984
- Hitachi, Ltd.
- Chusuke Munakata
- G01 - MEASURING TESTING