Teruaki YAMAZAKI

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Yokohama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus and measurement method
- Patent number 11,486,693
- Issue date Nov 1, 2022
- Lasertec Corporation
- Ko Gondaira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement apparatus, measurement method, and correction method
- Patent number 10,106,334
- Issue date Oct 23, 2018
- Lasertec Corporation
- Teruaki Yamazaki
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20200041251
- Publication date Feb 6, 2020
- Lasertec Corporation
- Ko GONDAIRA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND CORRECTION METHOD
- Publication number 20170355532
- Publication date Dec 14, 2017
- Lasertec Corporation
- Teruaki YAMAZAKI
- G01 - MEASURING TESTING