Teruhiko Funakura

Person

Itami, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test circuit for evaluating characteristic of analog signal of device
- Patent number 7,079,060
- Issue date Jul 18, 2006
- Renesas Technology Corp.
- Toshiaki Tarui
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing semiconductor integrated circuit
- Patent number 7,058,865
- Issue date Jun 6, 2006
- Renesas Technology Corp.
- Hisaya Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data storage apparatus and data measuring apparatus
- Patent number 6,990,614
- Issue date Jan 24, 2006
- Renesas Technology Corp.
- Hidekazau Nagasawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Interface circuit coupling semiconductor test apparatus with tested...
- Patent number 6,954,079
- Issue date Oct 11, 2005
- Renesas Technology Corp.
- Masaru Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
Jitter measurement circuit for measuring jitter of measurement targ...
- Patent number 6,934,648
- Issue date Aug 23, 2005
- Renesas Technology Corp.
- Hisayoshi Hanai
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing semiconductor integrated circuit
- Patent number 6,900,627
- Issue date May 31, 2005
- Renesas Technology Corp.
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing semiconductor integrated circuit
- Patent number 6,714,888
- Issue date Mar 30, 2004
- Renesas Technology Corp.
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing semiconductor integrated circuit
- Patent number 6,690,189
- Issue date Feb 10, 2004
- Renesas Technology Corp.
- Hisaya Mori
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Tester for semiconductor integrated circuits
- Patent number 6,661,248
- Issue date Dec 9, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Grant
External test auxiliary device to be used for testing semiconductor...
- Patent number 6,653,855
- Issue date Nov 25, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test apparatus, and method of testing semiconductor d...
- Patent number 6,651,023
- Issue date Nov 18, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Grant
Tester for semiconductor integrated circuits and method for testing...
- Patent number 6,642,736
- Issue date Nov 4, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Grant
Threshold analysis system capable of deciding all threshold voltage...
- Patent number 6,634,004
- Issue date Oct 14, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Shinji Yamada
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for testing semiconductor integrated circuit
- Patent number 6,628,137
- Issue date Sep 30, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test apparatus and method
- Patent number 6,587,975
- Issue date Jul 1, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G11 - INFORMATION STORAGE
Information Patent Grant
LSI testing apparatus
- Patent number 6,546,525
- Issue date Apr 8, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Masaru Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor tester, and method of testing semiconductor using the...
- Patent number 6,522,126
- Issue date Feb 18, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hisayoshi Hanai
- G01 - MEASURING TESTING
Information Patent Grant
External test ancillary device to be used for testing semiconductor...
- Patent number 6,456,102
- Issue date Sep 24, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Grant
LSI testing apparatus and timing calibration method for use therewith
- Patent number 6,281,698
- Issue date Aug 28, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Masaru Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test apparatus for measuring power supply current of...
- Patent number 5,959,463
- Issue date Sep 28, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Teruhiko Funakura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit with internal compensation for cha...
- Patent number 5,485,114
- Issue date Jan 16, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Teruhiko Funakura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor test apparatus
- Patent number 5,172,047
- Issue date Dec 15, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Teruhiko Funakura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test circuit for evaluating characteristic of analog signal of device
- Publication number 20050179576
- Publication date Aug 18, 2005
- RENESAS TECHNOLOGY CORP.
- Toshiaki Tarui
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing semiconductor integrated circuit
- Publication number 20040177302
- Publication date Sep 9, 2004
- RENESAS TECHNOLOGY CORP.
- Hisaya Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Interface circuit coupling semiconductor test apparatus with tested...
- Publication number 20040113642
- Publication date Jun 17, 2004
- RENESAS TECHNOLOGY CORP.
- Masaru Sugimoto
- G01 - MEASURING TESTING
Information Patent Application
Jitter measurement circuit for measuring jitter of measurement targ...
- Publication number 20040044488
- Publication date Mar 4, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Hisayoshi Hanai
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST APPARATUS AND METHOD
- Publication number 20030070121
- Publication date Apr 10, 2003
- HISAYA MORI
- G11 - INFORMATION STORAGE
Information Patent Application
Tester for semiconductor integrated circuits
- Publication number 20030048112
- Publication date Mar 13, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Application
External test auxiliary device to be used for testing semiconductor...
- Publication number 20020118007
- Publication date Aug 29, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for testing semiconductor integrated circuit
- Publication number 20020118017
- Publication date Aug 29, 2002
- Mitsubishi Denki Kabushiki Kaisha And Ryoden Semiconductor System Engineering...
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Application
EXTERNAL TEST ANCILLARY DEVICE TO BE USED FOR TESTING SEMICONDUCTOR...
- Publication number 20020105353
- Publication date Aug 8, 2002
- MITSUBISHI DENKI KABUSHIKI KAISHA, AND RYODEN SEMICONDUCTOR SYSTEM ENGINEERIN...
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing semiconductor integrated circuit
- Publication number 20020107654
- Publication date Aug 8, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test apparatus, and method of testing semiconductor d...
- Publication number 20020106817
- Publication date Aug 8, 2002
- Mitsubishi Denki Kabushiki Kaisha And Ryoden Semiconductor System Engineering...
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for testing semiconductor integrated circuit
- Publication number 20020108080
- Publication date Aug 8, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Apparatus and method for testing semiconductor integrated circuit
- Publication number 20020105352
- Publication date Aug 8, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Application
Tester for semiconductor integrated circuits and method for testing...
- Publication number 20020062200
- Publication date May 23, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Application
LSI testing apparatus
- Publication number 20020007479
- Publication date Jan 17, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Masaru Sugimoto
- G01 - MEASURING TESTING

Teruhiko Funakura

Person

Patents Grantslast 30 patents

Test circuit for evaluating characteristic of analog signal of device

Apparatus for testing semiconductor integrated circuit

Data storage apparatus and data measuring apparatus

Interface circuit coupling semiconductor test apparatus with tested...

Jitter measurement circuit for measuring jitter of measurement targ...

Apparatus and method for testing semiconductor integrated circuit

Apparatus for testing semiconductor integrated circuit

Apparatus and method for testing semiconductor integrated circuit

Tester for semiconductor integrated circuits

External test auxiliary device to be used for testing semiconductor...

Semiconductor test apparatus, and method of testing semiconductor d...

Tester for semiconductor integrated circuits and method for testing...

Threshold analysis system capable of deciding all threshold voltage...

Apparatus and method for testing semiconductor integrated circuit

Semiconductor test apparatus and method

LSI testing apparatus

Semiconductor tester, and method of testing semiconductor using the...

External test ancillary device to be used for testing semiconductor...

LSI testing apparatus and timing calibration method for use therewith

Semiconductor test apparatus for measuring power supply current of...

Semiconductor integrated circuit with internal compensation for cha...

Semiconductor test apparatus

Patents Applicationslast 30 patents

Test circuit for evaluating characteristic of analog signal of device

Apparatus for testing semiconductor integrated circuit

Interface circuit coupling semiconductor test apparatus with tested...

Jitter measurement circuit for measuring jitter of measurement targ...

SEMICONDUCTOR TEST APPARATUS AND METHOD

Tester for semiconductor integrated circuits

External test auxiliary device to be used for testing semiconductor...

Apparatus and method for testing semiconductor integrated circuit

EXTERNAL TEST ANCILLARY DEVICE TO BE USED FOR TESTING SEMICONDUCTOR...

Apparatus for testing semiconductor integrated circuit

Semiconductor test apparatus, and method of testing semiconductor d...

Apparatus and method for testing semiconductor integrated circuit

Apparatus and method for testing semiconductor integrated circuit

Tester for semiconductor integrated circuits and method for testing...

LSI testing apparatus