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Teruhiro YAMANO

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analysis apparatus
    • Patent number 10,537,893
    • Issue date Jan 21, 2020
    • Hitachi High-Technologies Corporation
    • Teruhiro Yamano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,784,754
    • Issue date Oct 10, 2017
    • Hitachi High-Technologies Corporation
    • Osamu Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,052,301
    • Issue date Jun 9, 2015
    • Hitachi High-Technologies Corporation
    • Shinji Azuma
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 8,911,685
    • Issue date Dec 16, 2014
    • Hitachi High-Technologies Corporation
    • Atsushi Watanabe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer with the function of rendering reagent informati...
    • Patent number 8,544,723
    • Issue date Oct 1, 2013
    • Hitachi High-Technologies Corporation
    • Teruhiro Yamano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,048,374
    • Issue date Nov 1, 2011
    • Hitachi High-Technologies Corporation
    • Teruhiro Yamano
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20230114608
    • Publication date Apr 13, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Erika INAGAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20220250957
    • Publication date Aug 11, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Katsuhiko SAKAMOTO
    • C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
  • Information Patent Application

    AUTOMATIC ANALYZER AND METHOD THEREOF
    • Publication number 20220011326
    • Publication date Jan 13, 2022
    • Takaaki HAGIWARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS APPARATUS
    • Publication number 20170151570
    • Publication date Jun 1, 2017
    • Hitachi High-Technologies Corporation
    • Teruhiro YAMANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150293134
    • Publication date Oct 15, 2015
    • Hitachi High-Technologies Corporation
    • Osamu Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20130115134
    • Publication date May 9, 2013
    • Shinji Azuma
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20120114526
    • Publication date May 10, 2012
    • Hitachi High-Technologies Corporation
    • Atsushi Watanabe
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER WITH THE FUNCTION OF RENDERING REAGENT INFORMATI...
    • Publication number 20120080516
    • Publication date Apr 5, 2012
    • Hitachi High-Technologies Corporation
    • Teruhiro Yamano
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20080199358
    • Publication date Aug 21, 2008
    • Teruhiro YAMANO
    • G01 - MEASURING TESTING