Teruhisa Yotsuya

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of and apparatus for inspecting substrate
- Patent number 7,869,644
- Issue date Jan 11, 2011
- Omron Corporation
- Kiyoshi Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Image processing method, substrate inspection method, substrate ins...
- Patent number 7,680,320
- Issue date Mar 16, 2010
- Omron Corporation
- Kiyoshi Murakami
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate inspection method and apparatus
- Patent number 7,512,260
- Issue date Mar 31, 2009
- Omron Corporation
- Kiyoshi Murakami
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for surface inspection and method and apparatus for inspe...
- Patent number 7,505,149
- Issue date Mar 17, 2009
- Omron Corporation
- Masato Ishiba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of generating image and illumination device for inspecting s...
- Patent number 7,394,084
- Issue date Jul 1, 2008
- Omron Corporation
- Jun Kuriyama
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and system for and method of producing component...
- Patent number 7,310,406
- Issue date Dec 18, 2007
- Omron Corporation
- Jun Kuriyama
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting printed circuit boards and the like, and m...
- Patent number 5,245,671
- Issue date Sep 14, 1993
- Omron Corporation
- Shigeki Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting packaged electronic device
- Patent number 5,093,797
- Issue date Mar 3, 1992
- Omron Tateisi Electronics Co.
- Teruhisa Yotsuya
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting packaged electronic device
- Patent number 5,027,295
- Issue date Jun 25, 1991
- Omron Tateisi Electronics Co.
- Teruhisa Yotsuya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for inspecting packaged electronic device
- Patent number 4,953,100
- Issue date Aug 28, 1990
- Omron Tateisi Electronics Co.
- Teruhisa Yotsuya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Input method for reference printed circuit board assembly data to a...
- Patent number 4,894,790
- Issue date Jan 16, 1990
- Omron Tateisi Electronics Co.
- Teruhisa Yotsuya
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Image processing method, substrate inspection method, substrate ins...
- Publication number 20060140471
- Publication date Jun 29, 2006
- OMRON CORPORATION
- Kiyoshi Murakami
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Substrate inspection method and apparatus
- Publication number 20060050267
- Publication date Mar 9, 2006
- Kiyoshi Murakami
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods of and apparatus for inspecting substrate
- Publication number 20060018531
- Publication date Jan 26, 2006
- OMRON CORPORATION
- Kiyoshi Murakami
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of generating image and illumination device for inspecting s...
- Publication number 20060000989
- Publication date Jan 5, 2006
- OMRON CORPORATION
- Jun Kuriyama
- G01 - MEASURING TESTING
Information Patent Application
Inspection method and system for and method of producing component...
- Publication number 20060002510
- Publication date Jan 5, 2006
- OMRON CORPORATION
- Jun Kuriyama
- G01 - MEASURING TESTING
Information Patent Application
Inspection method and system and production method of mounted subst...
- Publication number 20050209822
- Publication date Sep 22, 2005
- Masato Ishiba
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Apparatus for surface inspection and method and apparatus for inspe...
- Publication number 20050190361
- Publication date Sep 1, 2005
- OMRON CORPORATION
- Masato Ishiba
- G06 - COMPUTING CALCULATING COUNTING

Teruhisa Yotsuya

Person

Patents Grantslast 30 patents

Methods of and apparatus for inspecting substrate

Image processing method, substrate inspection method, substrate ins...

Substrate inspection method and apparatus

Apparatus for surface inspection and method and apparatus for inspe...

Method of generating image and illumination device for inspecting s...

Inspection method and system for and method of producing component...

Apparatus for inspecting printed circuit boards and the like, and m...

Apparatus for inspecting packaged electronic device

Apparatus for inspecting packaged electronic device

Apparatus for inspecting packaged electronic device

Input method for reference printed circuit board assembly data to a...

Patents Applicationslast 30 patents

Image processing method, substrate inspection method, substrate ins...

Substrate inspection method and apparatus

Methods of and apparatus for inspecting substrate

Method of generating image and illumination device for inspecting s...

Inspection method and system for and method of producing component...

Inspection method and system and production method of mounted subst...

Apparatus for surface inspection and method and apparatus for inspe...