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Teruki Hasegawa
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Sensor device, measurement system, and measurement method
Patent number
10,222,245
Issue date
Mar 5, 2019
Omron Corporation
Hiroshi Sameshima
G01 - MEASURING TESTING
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Patent Grant
Sensor device and monitoring system
Patent number
9,787,181
Issue date
Oct 10, 2017
Omron Corporation
Teruki Hasegawa
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Patents Applications
last 30 patents
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Patent Application
SENSOR DEVICE AND MONITORING SYSTEM
Publication number
20160056718
Publication date
Feb 25, 2016
Omron Corporation
Teruki Hasegawa
G01 - MEASURING TESTING
Information
Patent Application
SENSOR DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD
Publication number
20160041014
Publication date
Feb 11, 2016
Omron Corporation
Hiroshi Sameshima
G01 - MEASURING TESTING