Terumi Ito

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Saitama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for evaluating the quality of a semiconductor substrate
- Patent number 6,693,286
- Issue date Feb 17, 2004
- Mitsubishi Materials Silicon Corporation
- Takeshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluating the quality of a semiconductor...
- Patent number 6,534,774
- Issue date Mar 18, 2003
- Mitsubishi Materials Silicon Corporation
- Takeshi Hasegawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for evaluating the quality of a semiconductor...
- Publication number 20030094579
- Publication date May 22, 2003
- Takeshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for evaluating the quality of a semiconductor...
- Publication number 20020045283
- Publication date Apr 18, 2002
- Mitsubishi Materials Silicon Corporation
- Takeshi Hasegawa
- G01 - MEASURING TESTING