Teruo Shoji

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Patents Grantslast 30 patents

Information Patent Grant
Manufacturing method of semiconductor integrated circuit device
- Patent number 7,534,629
- Issue date May 19, 2009
- Renesas Technology Corp.
- Teruo Shoji
- G01 - MEASURING TESTING
Information Patent Grant
Probe sheet adhesion holder, probe card, semiconductor test device,...
- Patent number 7,423,439
- Issue date Sep 9, 2008
- Renesas Technology Corp.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication method of semiconductor integrated circuit device
- Patent number 7,351,597
- Issue date Apr 1, 2008
- Renesas Technology Corp.
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication method of semiconductor integrated circuit device
- Patent number 7,235,413
- Issue date Jun 26, 2007
- Renesas Technology Corp.
- Akio Hasebe
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication method of semiconductor integrated circuit device
- Patent number 7,219,422
- Issue date May 22, 2007
- Renesas Technology Corp.
- Yuji Wada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20070218572
- Publication date Sep 20, 2007
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20070207559
- Publication date Sep 6, 2007
- Akio Hasebe
- G01 - MEASURING TESTING
Information Patent Application
Probe sheet adhesion holder, probe card, semiconductor test device,...
- Publication number 20070103178
- Publication date May 10, 2007
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing method of semiconductor integrated circuit device
- Publication number 20060281222
- Publication date Dec 14, 2006
- Teruo Shoji
- G01 - MEASURING TESTING
Information Patent Application
Fabrication method of semiconductor integrated circuit device
- Publication number 20050095734
- Publication date May 5, 2005
- Akio Hasebe
- G01 - MEASURING TESTING
Information Patent Application
Fabrication method of semiconductor integrated circuit device
- Publication number 20040183556
- Publication date Sep 23, 2004
- Yuji Wada
- G01 - MEASURING TESTING