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Terutaka Mori
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Urayasu, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Connection device and test system
Patent number
7,541,202
Issue date
Jun 2, 2009
Renesas Technology Corp.
Susumu Kasukabe
G01 - MEASURING TESTING
Information
Patent Grant
Method for producing a semiconductor device with pyramidal bump ele...
Patent number
7,390,732
Issue date
Jun 24, 2008
Hitachi, Ltd.
Takayoshi Watanabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fabrication method of semiconductor integrated circuit device
Patent number
7,351,597
Issue date
Apr 1, 2008
Renesas Technology Corp.
Yuji Wada
G01 - MEASURING TESTING
Information
Patent Grant
Connection device and test system
Patent number
7,285,430
Issue date
Oct 23, 2007
Hitachi, Ltd.
Susumu Kasukabe
G01 - MEASURING TESTING
Information
Patent Grant
Fabrication method of semiconductor integrated circuit device
Patent number
7,219,422
Issue date
May 22, 2007
Renesas Technology Corp.
Yuji Wada
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and manufacturing method thereof including a p...
Patent number
7,198,962
Issue date
Apr 3, 2007
Hitachi, Ltd.
Ryuji Kohno
G01 - MEASURING TESTING
Information
Patent Grant
Connection device and test system
Patent number
6,759,258
Issue date
Jul 6, 2004
Renesas Technology Corp.
Susumu Kasukabe
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and manufacturing method thereof including a p...
Patent number
6,566,150
Issue date
May 20, 2003
Hitachi, Ltd.
Ryuji Kohno
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and manufacturing method thereof including a p...
Patent number
6,455,335
Issue date
Sep 24, 2002
Hitachi, Ltd.
Ryuji Kohno
G01 - MEASURING TESTING
Information
Patent Grant
Connector and probing system
Patent number
6,305,230
Issue date
Oct 23, 2001
Hitachi, Ltd.
Susumu Kasukabe
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and manufacturing method thereof including a p...
Patent number
6,197,603
Issue date
Mar 6, 2001
Hitachi, Ltd.
Ryuji Kohno
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
THIN FILM PROBE SHEET AND SEMICONDUCTOR CHIP INSPECTION SYSTEM
Publication number
20110014727
Publication date
Jan 20, 2011
Akira Yabushita
G01 - MEASURING TESTING
Information
Patent Application
CONNECTION DEVICE AND TEST SYSTEM
Publication number
20090209053
Publication date
Aug 20, 2009
Susumu KASUKABE
G01 - MEASURING TESTING
Information
Patent Application
Transmission Circuit, Connecting Sheet, Probe Sheet, Probe Card, Se...
Publication number
20080029763
Publication date
Feb 7, 2008
Susumu Kasukabe
G01 - MEASURING TESTING
Information
Patent Application
CONNECTION DEVICE AND TEST SYSTEM
Publication number
20080009082
Publication date
Jan 10, 2008
Susumu Kasukabe
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20070218572
Publication date
Sep 20, 2007
Yuji Wada
G01 - MEASURING TESTING
Information
Patent Application
Thin film probe sheet and semiconductor chip inspection system
Publication number
20060094162
Publication date
May 4, 2006
Akira Yabushita
G01 - MEASURING TESTING
Information
Patent Application
Connecting apparatus, semiconductor chip inspecting apparatus, and...
Publication number
20060043593
Publication date
Mar 2, 2006
Terutaka Mori
G01 - MEASURING TESTING
Information
Patent Application
Connection device and test system
Publication number
20040235207
Publication date
Nov 25, 2004
Susumu Kasukabe
G01 - MEASURING TESTING
Information
Patent Application
Fabrication method of semiconductor integrated circuit device
Publication number
20040183556
Publication date
Sep 23, 2004
Yuji Wada
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device and manufacturing method thereof including a p...
Publication number
20030203521
Publication date
Oct 30, 2003
Ryuji Kohno
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device and manufacturing method thereof including a p...
Publication number
20020182796
Publication date
Dec 5, 2002
Ryuji Kohno
G01 - MEASURING TESTING
Information
Patent Application
Connection device and test system
Publication number
20020129323
Publication date
Sep 12, 2002
Susumu Kasukabe
G01 - MEASURING TESTING