TREA

Teruyuki HARA

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Radar device
    • Patent number 11,960,023
    • Issue date Apr 16, 2024
    • Mitsubishi Electric Corporation
    • Kazuaki Maniwa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Radar signal processing device, radar device, and radar signal proc...
    • Patent number 11,614,533
    • Issue date Mar 28, 2023
    • Mitsubishi Electric Corporation
    • Tetsuro Furuta
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Radar device
    • Patent number 11,237,259
    • Issue date Feb 1, 2022
    • Mitsubishi Electric Corporation
    • Kazuaki Maniwa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Target detection device and target detection method
    • Patent number 11,231,486
    • Issue date Jan 25, 2022
    • Mitsubishi Electric Corporation
    • Kazuaki Maniwa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Radar apparatus
    • Patent number 11,163,051
    • Issue date Nov 2, 2021
    • Mitsubishi Electric Corporation
    • Satoshi Kageme
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Radar apparatus
    • Patent number 11,067,682
    • Issue date Jul 20, 2021
    • Mitsubishi Electric Corporation
    • Satoshi Kageme
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Radar device
    • Patent number 10,884,114
    • Issue date Jan 5, 2021
    • Mitsubishi Electric Corporation
    • Fuyuki Fukushima
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Radar signal processing apparatus and radar signal processing method
    • Patent number 10,809,369
    • Issue date Oct 20, 2020
    • Mitsubishi Electric Corporation
    • Hiroshi Sakamaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Dielectric boundary surface estimation device
    • Patent number 10,775,163
    • Issue date Sep 15, 2020
    • Mitsubishi Electric Corporation
    • Takehiro Hoshino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Radar system
    • Patent number 10,746,865
    • Issue date Aug 18, 2020
    • Mitsubishi Electric Corporation
    • Satoshi Kageme
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Synthetic aperture radar apparatus
    • Patent number 10,481,257
    • Issue date Nov 19, 2019
    • Mitsubishi Electric Corporation
    • Masayoshi Tsuchida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Radar system
    • Patent number 9,983,294
    • Issue date May 29, 2018
    • Mitsubishi Electric Corporation
    • Tadashi Oshima
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    RADAR SIGNAL PROCESSING DEVICE
    • Publication number 20200379099
    • Publication date Dec 3, 2020
    • Mitsubishi Electric Corporation
    • Hiroshi SAKAMAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    RADAR DEVICE
    • Publication number 20200348407
    • Publication date Nov 5, 2020
    • Mitsubishi Electric Corporation
    • Kazuaki MANIWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    RADAR SIGNAL PROCESSING DEVICE, RADAR DEVICE, AND RADAR SIGNAL PROC...
    • Publication number 20200301003
    • Publication date Sep 24, 2020
    • Mitsubishi Electric Corporation
    • Tetsuro FURUTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    RADAR SIGNAL PROCESSING APPARATUS AND RADAR SIGNAL PROCESSING METHOD
    • Publication number 20200233075
    • Publication date Jul 23, 2020
    • Mitsubishi Electric Corporation
    • Hiroshi SAKAMAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    DIELECTRIC BOUNDARY SURFACE ESTIMATION DEVICE
    • Publication number 20200232791
    • Publication date Jul 23, 2020
    • Mitsubishi Electric Corporation
    • Takehiro HOSHINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    RADAR DEVICE
    • Publication number 20200191934
    • Publication date Jun 18, 2020
    • Mitsubishi Electric Corporation
    • Kazuaki MANIWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    RADAR APPARATUS
    • Publication number 20200182994
    • Publication date Jun 11, 2020
    • Mitsubishi Electric Corporation
    • Satoshi KAGEME
    • G01 - MEASURING TESTING
  • Information Patent Application

    TARGET DETECTION DEVICE AND TARGET DETECTION METHOD
    • Publication number 20200132828
    • Publication date Apr 30, 2020
    • Mitsubishi Electric Corporation
    • Kazuaki MANIWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    RADAR APPARATUS
    • Publication number 20200011983
    • Publication date Jan 9, 2020
    • Mitsubishi Electric Corporation
    • Satoshi KAGEME
    • G01 - MEASURING TESTING
  • Information Patent Application

    RADAR SYSTEM
    • Publication number 20190339374
    • Publication date Nov 7, 2019
    • Mitsubishi Electric Corporation
    • Satoshi KAGEME
    • G01 - MEASURING TESTING
  • Information Patent Application

    RADAR DEVICE
    • Publication number 20190101635
    • Publication date Apr 4, 2019
    • Mitsubishi Electric Corporation
    • Fuyuki FUKUSHIMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SYNTHETIC APERTURE RADAR APPARATUS
    • Publication number 20170299715
    • Publication date Oct 19, 2017
    • MITSUBISHI ELECTRIC CORPORATION
    • Masayoshi TSUCHIDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    TARGET TYPE IDENTIFICATION DEVICE
    • Publication number 20160189002
    • Publication date Jun 30, 2016
    • Mitsubishi Electric Corporation
    • Kaori KAWAKAMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    PASSIVE RADAR DEVICE
    • Publication number 20150355322
    • Publication date Dec 10, 2015
    • Mitsubishi Electric Corporation
    • Tadashi OSHIMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    RADAR SYSTEM
    • Publication number 20150338505
    • Publication date Nov 26, 2015
    • Mitsubishi Electric Corporation
    • Tadashi OSHIMA
    • G01 - MEASURING TESTING