Teruyuki NISHIMURA

Person

Matsumoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Image processing method, and spectral camera system
- Patent number 12,039,761
- Issue date Jul 16, 2024
- Seiko Epson Corporation
- Kei Kudo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging apparatus, portable terminal apparatus, and imaging method
- Patent number 11,870,969
- Issue date Jan 9, 2024
- Seiko Epson Corporation
- Teruyuki Nishimura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical device and electronic device
- Patent number 11,536,884
- Issue date Dec 27, 2022
- Seiko Epson Corporation
- Tomonori Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
Image generation apparatus and image generation method
- Patent number 11,503,254
- Issue date Nov 15, 2022
- Seiko Epson Corporation
- Kei Kudo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical device and electronic apparatus
- Patent number 11,442,328
- Issue date Sep 13, 2022
- Seiko Epson Corporation
- Yasushi Matsuno
- G02 - OPTICS
Information Patent Grant
Image processing method, image processing device, and information s...
- Patent number 11,412,161
- Issue date Aug 9, 2022
- Seiko Epson Corporation
- Teruyuki Nishimura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wavelength tunable optical filter, optical module, and electronic a...
- Patent number 11,307,478
- Issue date Apr 19, 2022
- Seiko Epson Corporation
- Susumu Shinto
- G02 - OPTICS
Information Patent Grant
Spectroscopic camera
- Patent number 11,112,307
- Issue date Sep 7, 2021
- Seiko Epson Corporation
- Tomonori Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic camera and electronic device
- Patent number 10,921,185
- Issue date Feb 16, 2021
- Seiko Epson Corporation
- Teruyuki Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic measurement device, image forming apparatus, and spec...
- Patent number 9,976,899
- Issue date May 22, 2018
- Seiko Epson Corporation
- Teruyuki Nishimura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interference filter and MEMS element having connected first and sec...
- Patent number 9,971,143
- Issue date May 15, 2018
- Seiko Epson Corporation
- Teruyuki Nishimura
- G02 - OPTICS
Information Patent Grant
Spectroscopic image acquiring apparatus and spectroscopic image acq...
- Patent number 9,835,492
- Issue date Dec 5, 2017
- Seiko Epson Corporation
- Teruyuki Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Variable wavelength interference filter, optical filter device, opt...
- Patent number 9,753,199
- Issue date Sep 5, 2017
- Seiko Epson Corporation
- Teruyuki Nishimura
- G02 - OPTICS
Information Patent Grant
Variable wavelength interference filter, optical module, and optica...
- Patent number 9,664,890
- Issue date May 30, 2017
- Seiko Epson Corporation
- Teruyuki Nishimura
- G02 - OPTICS
Information Patent Grant
Wavelength-variable interference filter, optical module, and optica...
- Patent number 9,557,554
- Issue date Jan 31, 2017
- Seiko Epson Corporation
- Teruyuki Nishimura
- G02 - OPTICS
Information Patent Grant
Actuator control device, optical module, and electronic apparatus
- Patent number 9,547,166
- Issue date Jan 17, 2017
- Seiko Epson Corporation
- Ryohei Kuri
- G02 - OPTICS
Information Patent Grant
Printing apparatus
- Patent number 9,506,805
- Issue date Nov 29, 2016
- Seiko Epson Corporation
- Ryohei Kuri
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength tunable interference filter, optical filter device, opti...
- Patent number 9,429,694
- Issue date Aug 30, 2016
- Seiko Epson Corporation
- Teruyuki Nishimura
- G02 - OPTICS
Information Patent Grant
Spectroscopic measurement device and spectroscopic measurement method
- Patent number 9,291,502
- Issue date Mar 22, 2016
- Seiko Epson Corporation
- Teruyuki Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Variable wavelength interference filter, optical module, and optica...
- Patent number 8,917,451
- Issue date Dec 23, 2014
- Seiko Epson Corporation
- Teruyuki Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Optical filter, optical filter module, and photometric analyzer
- Patent number 8,848,293
- Issue date Sep 30, 2014
- Seiko Epson Corporation
- Teruyuki Nishimura
- G02 - OPTICS
Information Patent Grant
Spectrophotometer having prompt spectrophotometric measurement
- Patent number 8,848,196
- Issue date Sep 30, 2014
- Seiko Epson Corporation
- Teruyuki Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Interference filter having adhesive and warp reduction grooves
- Patent number 8,559,111
- Issue date Oct 15, 2013
- Seiko Epson Corporation
- Teruyuki Nishimura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE PROCESSING METHOD, AND SPECTRAL CAMERA SYSTEM
- Publication number 20230137388
- Publication date May 4, 2023
- SEIKO EPSON CORPORATION
- Kei KUDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERFERENCE FILTER, AND METHOD OF MANUFACTURING INTERFERENCE FILTER
- Publication number 20230009008
- Publication date Jan 12, 2023
- SEIKO EPSON CORPORATION
- Tomoki SAKASHITA
- G02 - OPTICS
Information Patent Application
IMAGE GENERATION APPARATUS AND IMAGE GENERATION METHOD
- Publication number 20210385419
- Publication date Dec 9, 2021
- SEIKO EPSON CORPORATION
- Kei KUDO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMAGING APPARATUS, PORTABLE TERMINAL APPARATUS, AND IMAGING METHOD
- Publication number 20210377510
- Publication date Dec 2, 2021
- SEIKO EPSON CORPORATION
- Teruyuki NISHIMURA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMAGE PROCESSING METHOD, IMAGE PROCESSING DEVICE, AND INFORMATION S...
- Publication number 20210037198
- Publication date Feb 4, 2021
- SEIKO EPSON CORPORATION
- Teruyuki NISHIMURA
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic Camera
- Publication number 20210025754
- Publication date Jan 28, 2021
- SEIKO EPSON CORPORATION
- Tomonori MATSUSHITA
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY METHOD, DISPLAY DEVICE, AND INFORMATION SYSTEM
- Publication number 20200382688
- Publication date Dec 3, 2020
- SEIKO EPSON CORPORATION
- Ryoki Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTROSCOPIC CAMERA AND ELECTRONIC DEVICE
- Publication number 20200173849
- Publication date Jun 4, 2020
- SEIKO EPSON CORPORATION
- Teruyuki NISHIMURA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL DEVICE AND ELECTRONIC APPARATUS
- Publication number 20200103721
- Publication date Apr 2, 2020
- SEIKO EPSON CORPORATION
- Yasushi Matsuno
- G02 - OPTICS
Information Patent Application
Optical Device And Electronic Device
- Publication number 20200073034
- Publication date Mar 5, 2020
- SEIKO EPSON CORPORATION
- Tomonori MATSUSHITA
- G02 - OPTICS
Information Patent Application
WAVELENGTH TUNABLE OPTICAL FILTER, OPTICAL MODULE, AND ELECTRONIC A...
- Publication number 20190064628
- Publication date Feb 28, 2019
- SEIKO EPSON CORPORATION
- Susumu SHINTO
- G02 - OPTICS
Information Patent Application
Head Mounted Display
- Publication number 20180285642
- Publication date Oct 4, 2018
- SEIKO EPSON CORPORATION
- Teruyuki Nishimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTROSCOPIC MEASUREMENT DEVICE, IMAGE FORMING APPARATUS, AND SPEC...
- Publication number 20160370230
- Publication date Dec 22, 2016
- SEIKO EPSON CORPORATION
- Teruyuki Nishimura
- G01 - MEASURING TESTING
Information Patent Application
PRINTING APPARATUS
- Publication number 20160176197
- Publication date Jun 23, 2016
- SEIKO EPSON CORPORATION
- Ryohei KURI
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
SPECTROSCOPIC IMAGE ACQUIRING APPARATUS AND SPECTROSCOPIC IMAGE ACQ...
- Publication number 20160061661
- Publication date Mar 3, 2016
- SEIKO EPSON CORPORATION
- Teruyuki Nishimura
- G01 - MEASURING TESTING
Information Patent Application
ACTUATOR CONTROL DEVICE, OPTICAL MODULE, AND ELECTRONIC APPARATUS
- Publication number 20150212314
- Publication date Jul 30, 2015
- Seko Epson Corporation
- Ryohei KURI
- G02 - OPTICS
Information Patent Application
VARIABLE WAVELENGTH INTERFERENCE FILTER, OPTICAL MODULE, AND OPTICA...
- Publication number 20150070767
- Publication date Mar 12, 2015
- SEIKO EPSON CORPORATION
- Teruyuki NISHIMURA
- G02 - OPTICS
Information Patent Application
INTERFERENCE FILTER, OPTICAL FILTER DEVICE, OPTICAL MODULE, ELECTRO...
- Publication number 20150029591
- Publication date Jan 29, 2015
- SEIKO EPSON CORPORATION
- Teruyuki NISHIMURA
- G02 - OPTICS
Information Patent Application
COLORATION MEASURING APPARATUS
- Publication number 20140285798
- Publication date Sep 25, 2014
- Seiko Epson Corporation
- Teruyuki NISHIMURA
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE-WAVELENGTH INTERFERENCE FILTER, OPTICAL FILTER DEVICE, OPT...
- Publication number 20140240837
- Publication date Aug 28, 2014
- SEIKO EPSON CORPORATION
- Teruyuki Nishimura
- G02 - OPTICS
Information Patent Application
WAVELENGTH TUNABLE INTERFERENCE FILTER, OPTICAL FILTER DEVICE, OPTI...
- Publication number 20140092479
- Publication date Apr 3, 2014
- SEIKO EPSON CORPORATION
- Teruyuki NISHIMURA
- G02 - OPTICS
Information Patent Application
SPECTROSCOPIC MEASUREMENT DEVICE AND SPECTROSCOPIC MEASUREMENT METHOD
- Publication number 20140009761
- Publication date Jan 9, 2014
- Teruyuki Nishimura
- G02 - OPTICS
Information Patent Application
VARIABLE WAVELENGTH INTERFERENCE FILTER, OPTICAL FILTER DEVICE, OPT...
- Publication number 20130271839
- Publication date Oct 17, 2013
- SEIKO EPSON CORPORATION
- Teruyuki NISHIMURA
- G02 - OPTICS
Information Patent Application
SPECTROPHOTOMETER
- Publication number 20130107262
- Publication date May 2, 2013
- SEIKO EPSON CORPORATION
- Teruyuki NISHIMURA
- G02 - OPTICS
Information Patent Application
WAVELENGTH VARIABLE INTERFERENCE FILTER, OPTICAL FILTER DEVICE, OPT...
- Publication number 20130083400
- Publication date Apr 4, 2013
- SEIKO EPSON CORPORATION
- Teruyuki Nishimura
- G02 - OPTICS
Information Patent Application
VARIABLE WAVELENGTH INTERFERENCE FILTER, OPTICAL MODULE, AND OPTICA...
- Publication number 20130044377
- Publication date Feb 21, 2013
- SEIKO EPSON CORPORATION
- Teruyuki NISHIMURA
- G02 - OPTICS
Information Patent Application
OPTICAL FILTER, OPTICAL FILTER MODULE, AND PHOTOMETRIC ANALYZER
- Publication number 20120287438
- Publication date Nov 15, 2012
- SEIKO EPSON CORPORATION
- Teruyuki NISHIMURA
- G02 - OPTICS
Information Patent Application
WAVELENGTH-VARIABLE INTERFERENCE FILTER, OPTICAL MODULE, AND OPTICA...
- Publication number 20120050869
- Publication date Mar 1, 2012
- SEIKO EPSON CORPORATION
- Teruyuki NISHIMURA
- G02 - OPTICS
Information Patent Application
INTERFERENCE FILTER, OPTICAL SENSOR, AND OPTICAL MODULE
- Publication number 20110128549
- Publication date Jun 2, 2011
- SEIKO EPSON CORPORATION
- Teruyuki NISHIMURA
- G02 - OPTICS

Teruyuki NISHIMURA

Person

Patents Grantslast 30 patents

Image processing method, and spectral camera system

Imaging apparatus, portable terminal apparatus, and imaging method

Optical device and electronic device

Image generation apparatus and image generation method

Optical device and electronic apparatus

Image processing method, image processing device, and information s...

Wavelength tunable optical filter, optical module, and electronic a...

Spectroscopic camera

Spectroscopic camera and electronic device

Spectroscopic measurement device, image forming apparatus, and spec...

Interference filter and MEMS element having connected first and sec...

Spectroscopic image acquiring apparatus and spectroscopic image acq...

Variable wavelength interference filter, optical filter device, opt...

Variable wavelength interference filter, optical module, and optica...

Wavelength-variable interference filter, optical module, and optica...

Actuator control device, optical module, and electronic apparatus

Printing apparatus

Wavelength tunable interference filter, optical filter device, opti...

Spectroscopic measurement device and spectroscopic measurement method

Variable wavelength interference filter, optical module, and optica...

Optical filter, optical filter module, and photometric analyzer

Spectrophotometer having prompt spectrophotometric measurement

Interference filter having adhesive and warp reduction grooves

Patents Applicationslast 30 patents

IMAGE PROCESSING METHOD, AND SPECTRAL CAMERA SYSTEM

INTERFERENCE FILTER, AND METHOD OF MANUFACTURING INTERFERENCE FILTER

IMAGE GENERATION APPARATUS AND IMAGE GENERATION METHOD

IMAGING APPARATUS, PORTABLE TERMINAL APPARATUS, AND IMAGING METHOD

IMAGE PROCESSING METHOD, IMAGE PROCESSING DEVICE, AND INFORMATION S...

Spectroscopic Camera

DISPLAY METHOD, DISPLAY DEVICE, AND INFORMATION SYSTEM

SPECTROSCOPIC CAMERA AND ELECTRONIC DEVICE

OPTICAL DEVICE AND ELECTRONIC APPARATUS

Optical Device And Electronic Device

WAVELENGTH TUNABLE OPTICAL FILTER, OPTICAL MODULE, AND ELECTRONIC A...

Head Mounted Display

SPECTROSCOPIC MEASUREMENT DEVICE, IMAGE FORMING APPARATUS, AND SPEC...

PRINTING APPARATUS

SPECTROSCOPIC IMAGE ACQUIRING APPARATUS AND SPECTROSCOPIC IMAGE ACQ...

ACTUATOR CONTROL DEVICE, OPTICAL MODULE, AND ELECTRONIC APPARATUS

VARIABLE WAVELENGTH INTERFERENCE FILTER, OPTICAL MODULE, AND OPTICA...

INTERFERENCE FILTER, OPTICAL FILTER DEVICE, OPTICAL MODULE, ELECTRO...

COLORATION MEASURING APPARATUS

VARIABLE-WAVELENGTH INTERFERENCE FILTER, OPTICAL FILTER DEVICE, OPT...

WAVELENGTH TUNABLE INTERFERENCE FILTER, OPTICAL FILTER DEVICE, OPTI...

SPECTROSCOPIC MEASUREMENT DEVICE AND SPECTROSCOPIC MEASUREMENT METHOD

VARIABLE WAVELENGTH INTERFERENCE FILTER, OPTICAL FILTER DEVICE, OPT...

SPECTROPHOTOMETER

WAVELENGTH VARIABLE INTERFERENCE FILTER, OPTICAL FILTER DEVICE, OPT...

VARIABLE WAVELENGTH INTERFERENCE FILTER, OPTICAL MODULE, AND OPTICA...

OPTICAL FILTER, OPTICAL FILTER MODULE, AND PHOTOMETRIC ANALYZER

WAVELENGTH-VARIABLE INTERFERENCE FILTER, OPTICAL MODULE, AND OPTICA...

INTERFERENCE FILTER, OPTICAL SENSOR, AND OPTICAL MODULE