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Tetsuhiro KOYAMA
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Tokyo, JP
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last 30 patents
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Patent Grant
Temperature measurement circuit and method, and microcomputer unit
Patent number
10,670,478
Issue date
Jun 2, 2020
Renesas Electronics Corporation
Chiaki Kumahara
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SEMICONDUCTOR DEVICE AND TEMPERATURE CHARACTERISTIC TEST METHOD THE...
Publication number
20240094064
Publication date
Mar 21, 2024
RENESAS ELECTRONICS CORPORATION
Tadashi KAMEYAMA
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE MEASUREMENT CIRCUIT AND METHOD, AND MICROCOMPUTER UNIT
Publication number
20180156675
Publication date
Jun 7, 2018
RENESAS ELECTRONICS CORPORATION
Chiaki KUMAHARA
G01 - MEASURING TESTING