Tetsuhiro Nanbu

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe card, having cantilever-type probe and method
- Patent number 7,256,591
- Issue date Aug 14, 2007
- Fujitsu Limited
- Tsutomu Tatematsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe card and probe contact method
- Publication number 20030098702
- Publication date May 29, 2003
- FUJITSU LIMITED
- Tsutomu Tatematsu
- G01 - MEASURING TESTING
Information Patent Application
Probe card, semiconductor device testing apparatus, and probe conta...
- Publication number 20030098701
- Publication date May 29, 2003
- FUJITSU LIMITED
- Tsutomu Tatematsu
- G01 - MEASURING TESTING