Tetsuhisa Nakano

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Shizuoka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Film thickness measurement method and film thickness measurement de...
- Patent number 9,846,028
- Issue date Dec 19, 2017
- Hamamatsu Photonics K.K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness measurement device and film thickness measurement me...
- Patent number 8,885,173
- Issue date Nov 11, 2014
- Hamamatsu Photonics K.K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Reflectivity measuring device, reflectivity measuring method, membr...
- Patent number 8,699,023
- Issue date Apr 15, 2014
- Hamamatsu Photonics K.K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness measurement device and measurement method
- Patent number 8,649,023
- Issue date Feb 11, 2014
- Hamamatsu Photonics K.K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FILM THICKNESS MEASUREMENT METHOD AND FILM THICKNESS MEASUREMENT DE...
- Publication number 20160349038
- Publication date Dec 1, 2016
- HAMAMATSU PHOTONICS K. K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Application
REFLECTIVITY MEASURING DEVICE, REFLECTIVITY MEASURING METHOD, MEMBR...
- Publication number 20130169968
- Publication date Jul 4, 2013
- Hamamatsu Photonics K.K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE AND FILM THICKNESS MEASUREMENT ME...
- Publication number 20120218561
- Publication date Aug 30, 2012
- HAMAMATSU PHOTONICS K. K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE AND MEASUREMENT METHOD
- Publication number 20110299097
- Publication date Dec 8, 2011
- Hamamatsu Photonics K. K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING