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Tetsuichi Wazawa
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Miyagi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Localized plasmon resonance sensor and examining device
Patent number
7,906,344
Issue date
Mar 15, 2011
Omron Corporation
Tomohiko Matsushita
G01 - MEASURING TESTING
Information
Patent Grant
Method of transcribing biomolecular patterns, method of manufacturi...
Patent number
7,501,241
Issue date
Mar 10, 2009
Omron Corporation
Tomohiko Matsushita
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical analyzing unit and optical analyzing device
Patent number
7,342,663
Issue date
Mar 11, 2008
OMRON Corporation
Tomohiko Matsushita
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Surface Plasmon Resonance Sensor
Publication number
20080037022
Publication date
Feb 14, 2008
Takeo Nishikawa
G01 - MEASURING TESTING
Information
Patent Application
Localized Plasmon Resonance Sensor and Examining Device
Publication number
20070273884
Publication date
Nov 29, 2007
Tomohiko Matsushita
G01 - MEASURING TESTING
Information
Patent Application
Substrate for immobilizing biomolecules, biochip, and biosensor
Publication number
20070224639
Publication date
Sep 27, 2007
Omron Corporation
Tomohiko Matsushita
G01 - MEASURING TESTING
Information
Patent Application
Optical Analyzing Unit and Optical Analyzing Device
Publication number
20070211254
Publication date
Sep 13, 2007
Omron Corporation
Tomohiko Matsushita
G01 - MEASURING TESTING
Information
Patent Application
Method of transcribing biomolecular patterns, method of manufacturi...
Publication number
20050046758
Publication date
Mar 3, 2005
Tomohiko Matsushita
B81 - MICRO-STRUCTURAL TECHNOLOGY