Tetsuji Anai

Person

Tokyo-to, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement system, measurement method, and measurement program
- Patent number 11,630,208
- Issue date Apr 18, 2023
- Topcon Corporation
- Nobuyuki Nishita
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 11,598,637
- Issue date Mar 7, 2023
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument and surveying instrument system
- Patent number 11,598,874
- Issue date Mar 7, 2023
- TOPCON Corporation
- Fumio Ohtomo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Surveying instrument
- Patent number 11,512,957
- Issue date Nov 29, 2022
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 11,421,989
- Issue date Aug 23, 2022
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 11,415,414
- Issue date Aug 16, 2022
- TOPCON Corporation
- Fumio Ohtomo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surveying instrument
- Patent number 11,402,207
- Issue date Aug 2, 2022
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 11,333,496
- Issue date May 17, 2022
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 11,293,754
- Issue date Apr 5, 2022
- TOPCON Corporation
- Satoshi Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument and photogrammetric method
- Patent number 11,193,765
- Issue date Dec 7, 2021
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method and laser scanner
- Patent number 11,150,346
- Issue date Oct 19, 2021
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying system
- Patent number 10,921,430
- Issue date Feb 16, 2021
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 10,520,307
- Issue date Dec 31, 2019
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Survey data processing device, survey data processing method, and p...
- Patent number 10,331,972
- Issue date Jun 25, 2019
- Kabushiki Kaisha Topcon
- Daisuke Sasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surveying system
- Patent number 10,281,580
- Issue date May 7, 2019
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Survey data processing device, survey data processing method, and s...
- Patent number 10,198,632
- Issue date Feb 5, 2019
- Topcon Corporation
- Takeshi Sasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring instrument and surveying system
- Patent number 10,048,063
- Issue date Aug 14, 2018
- TOPCON Corporation
- Fumio Ohtomo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Survey data processing device, survey data processing method, and p...
- Patent number 9,911,038
- Issue date Mar 6, 2018
- Takeshi Sasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring instrument and surveying system
- Patent number 9,897,436
- Issue date Feb 20, 2018
- TOPCON Corporation
- Fumio Ohtomo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Survey data processing device, survey data processing method, and p...
- Patent number 9,736,360
- Issue date Aug 15, 2017
- Kabushiki Kaisha Topcon
- Daisuke Sasaki
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Image pickup method and photographing device
- Patent number 9,648,304
- Issue date May 9, 2017
- Kabushiki Kaisha Topcon
- Fumio Ohtomo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Surveying apparatus
- Patent number 9,571,794
- Issue date Feb 14, 2017
- Kabushiki Kaisha Topcon
- Kaoru Kumagai
- G02 - OPTICS
Information Patent Grant
Rotation angle detecting apparatus and surveying instrument
- Patent number 9,541,382
- Issue date Jan 10, 2017
- Kabushiki Kaisha Topcon
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Aerial photographing system
- Patent number 9,409,656
- Issue date Aug 9, 2016
- Kabushiki Kaisha Topcon
- Fumio Ohtomo
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Rotation angle detecting apparatus
- Patent number 9,228,858
- Issue date Jan 5, 2016
- Kabushiki Kaisha Topcon
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Device, method, and recording medium for detecting and removing mis...
- Patent number 9,171,225
- Issue date Oct 27, 2015
- Kabushiki Kaisha Topcon
- Nobuyuki Fukaya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Remote control system
- Patent number 9,158,305
- Issue date Oct 13, 2015
- Kabushiki Kaisha Topcon
- Fumio Ohtomo
- G05 - CONTROLLING REGULATING
Information Patent Grant
Aerial photograph image pickup method and aerial photograph image p...
- Patent number 9,013,576
- Issue date Apr 21, 2015
- Kabushiki Kaisha Topcon
- Fumio Ohtomo
- G05 - CONTROLLING REGULATING
Information Patent Grant
Aerial photograph image pickup method and aerial photograph image p...
- Patent number 9,007,461
- Issue date Apr 14, 2015
- Kabushiki Kaisha Topcon
- Fumio Ohtomo
- G05 - CONTROLLING REGULATING
Information Patent Grant
Aerial photogrammetry and aerial photogrammetric system
- Patent number 8,953,933
- Issue date Feb 10, 2015
- Kabushiki Kaisha Topcon
- Fumio Ohtomo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Surveying Instrument And Surveying System
- Publication number 20210382143
- Publication date Dec 9, 2021
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument And Surveying Instrument System
- Publication number 20210293962
- Publication date Sep 23, 2021
- TOPCON CORPORATION
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20200386546
- Publication date Dec 10, 2020
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20200386547
- Publication date Dec 10, 2020
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND MEASUREMENT PROGRAM
- Publication number 20200363530
- Publication date Nov 19, 2020
- TOPCON CORPORATION
- Nobuyuki NISHITA
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20200318963
- Publication date Oct 8, 2020
- TOPCON CORPORATION
- Satoshi Hirano
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20200318966
- Publication date Oct 8, 2020
- TOPCON Corporation
- Satoshi Hirano
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument And Photogrammetric Method
- Publication number 20200182614
- Publication date Jun 11, 2020
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20200081266
- Publication date Mar 12, 2020
- TOPCON CORPORATION
- Fumio Ohtomo
- G02 - OPTICS
Information Patent Application
Surveying Instrument
- Publication number 20190360806
- Publication date Nov 28, 2019
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20190339075
- Publication date Nov 7, 2019
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20190186912
- Publication date Jun 20, 2019
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying System
- Publication number 20180329040
- Publication date Nov 15, 2018
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Measuring Instrument And Surveying System
- Publication number 20180135973
- Publication date May 17, 2018
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Measuring Method And Laser Scanner
- Publication number 20180052232
- Publication date Feb 22, 2018
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Measuring Instrument And Surveying System
- Publication number 20170350692
- Publication date Dec 7, 2017
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20170227357
- Publication date Aug 10, 2017
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Surveying System
- Publication number 20170131404
- Publication date May 11, 2017
- TOPCON Corporation
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
SURVEY DATA PROCESSING DEVICE, SURVEY DATA PROCESSING METHOD, AND S...
- Publication number 20170004345
- Publication date Jan 5, 2017
- TOPCON CORPORATION
- Takeshi SASAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURVEY DATA PROCESSING DEVICE, SURVEY DATA PROCESSING METHOD, AND P...
- Publication number 20160217589
- Publication date Jul 28, 2016
- Kabushiki Kaisha TOPCON
- Daisuke Sasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURVEY DATA PROCESSING DEVICE, SURVEY DATA PROCESSING METHOD, AND P...
- Publication number 20160217582
- Publication date Jul 28, 2016
- Kabushiki Kaisha TOPCON
- Takeshi SASAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURVEY DATA PROCESSING DEVICE, SURVEY DATA PROCESSING METHOD, AND P...
- Publication number 20160219215
- Publication date Jul 28, 2016
- KABUSHIKI KAISHA TOPCON
- Daisuke SASAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Rotation Angle Detecting Apparatus
- Publication number 20150108338
- Publication date Apr 23, 2015
- Kabushiki Kaisha TOPCON
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Aerial Photographing System
- Publication number 20140240498
- Publication date Aug 28, 2014
- Kabushiki Kaisha TOPCON
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Aerial Photogrammetry And Aerial Photogrammetric System
- Publication number 20140119716
- Publication date May 1, 2014
- Kabushiki Kaisha TOPCON
- Fumio Ohtomo
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
Image Pickup Method And Photographing Device
- Publication number 20130321591
- Publication date Dec 5, 2013
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
Rotation Angle Detecting Apparatus
- Publication number 20130284909
- Publication date Oct 31, 2013
- Kabushiki Kaisha TOPCON
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Application
MOVING IMAGE PROCESSING DEVICE, MOVING IMAGE PROCESSING METHOD, AND...
- Publication number 20130236107
- Publication date Sep 12, 2013
- KABUSHIKI KAISHA TOPCON
- Nobuyuki FUKAYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Rotation Angle Detecting Apparatus And Surveying Instrument
- Publication number 20130155397
- Publication date Jun 20, 2013
- Kabushiki Kaisha TOPCON
- Kaoru Kumagai
- G01 - MEASURING TESTING
Information Patent Application
Rotation Angle Detecting Apparatus And Surveying Instrument
- Publication number 20130155224
- Publication date Jun 20, 2013
- Kabushiki Kaisha TOPCON
- Fumio Ohtomo
- G01 - MEASURING TESTING

Tetsuji Anai

Person

Patents Grantslast 30 patents

Measurement system, measurement method, and measurement program

Surveying instrument

Surveying instrument and surveying instrument system

Surveying instrument

Surveying instrument

Surveying instrument

Surveying instrument

Surveying instrument

Surveying instrument

Surveying instrument and photogrammetric method

Measuring method and laser scanner

Surveying system

Surveying instrument

Survey data processing device, survey data processing method, and p...

Surveying system

Survey data processing device, survey data processing method, and s...

Measuring instrument and surveying system

Survey data processing device, survey data processing method, and p...

Measuring instrument and surveying system

Survey data processing device, survey data processing method, and p...

Image pickup method and photographing device

Surveying apparatus

Rotation angle detecting apparatus and surveying instrument

Aerial photographing system

Rotation angle detecting apparatus

Device, method, and recording medium for detecting and removing mis...

Remote control system

Aerial photograph image pickup method and aerial photograph image p...

Aerial photograph image pickup method and aerial photograph image p...

Aerial photogrammetry and aerial photogrammetric system

Patents Applicationslast 30 patents

Surveying Instrument And Surveying System

Surveying Instrument And Surveying Instrument System

Surveying Instrument

Surveying Instrument

MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND MEASUREMENT PROGRAM

Surveying Instrument

Surveying Instrument

Surveying Instrument And Photogrammetric Method

Surveying Instrument

Surveying Instrument

Surveying Instrument

Surveying Instrument

Surveying System

Measuring Instrument And Surveying System

Measuring Method And Laser Scanner

Measuring Instrument And Surveying System

Surveying Instrument

Surveying System

SURVEY DATA PROCESSING DEVICE, SURVEY DATA PROCESSING METHOD, AND S...

SURVEY DATA PROCESSING DEVICE, SURVEY DATA PROCESSING METHOD, AND P...

SURVEY DATA PROCESSING DEVICE, SURVEY DATA PROCESSING METHOD, AND P...

SURVEY DATA PROCESSING DEVICE, SURVEY DATA PROCESSING METHOD, AND P...

Rotation Angle Detecting Apparatus

Aerial Photographing System

Aerial Photogrammetry And Aerial Photogrammetric System

Image Pickup Method And Photographing Device

Rotation Angle Detecting Apparatus

MOVING IMAGE PROCESSING DEVICE, MOVING IMAGE PROCESSING METHOD, AND...

Rotation Angle Detecting Apparatus And Surveying Instrument

Rotation Angle Detecting Apparatus And Surveying Instrument