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Tetsuji Kawahara

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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer
    • Patent number 12,235,282
    • Issue date Feb 25, 2025
    • HITACHI HIGH-TECH CORPORATION
    • Yosuke Horie
    • B08 - CLEANING
  • Information Patent Grant

    Electrolyte analyzing device
    • Patent number 12,123,847
    • Issue date Oct 22, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Masaki Hara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electrolyte analyzing device
    • Patent number 11,982,681
    • Issue date May 14, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Takushi Miyakawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Bubble detection in an automated analysis device
    • Patent number 11,971,427
    • Issue date Apr 30, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Akinao Fujita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Bubble detection in an automated analysis device
    • Patent number 11,933,803
    • Issue date Mar 19, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Akinao Fujita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test method and dispensing device
    • Patent number 11,879,902
    • Issue date Jan 23, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Nojima
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Nozzle cleaner and automatic analyzer using the same
    • Patent number 11,819,890
    • Issue date Nov 21, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takushi Miyakawa
    • B08 - CLEANING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,656,238
    • Issue date May 23, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takashi Nakasawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,624,752
    • Issue date Apr 11, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Tooru Inaba
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Ultrasonic cleaner and automatic analyzer using the same
    • Patent number 11,420,236
    • Issue date Aug 23, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Kohei Nonaka
    • B08 - CLEANING
  • Information Patent Grant

    Ultrasonic cleaner and automatic analyzer using the same
    • Patent number 11,260,430
    • Issue date Mar 1, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yosuke Horie
    • B08 - CLEANING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,156,628
    • Issue date Oct 26, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Takamichi Mori
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Ultrasonic cleaner and automatic analyzer using the same
    • Patent number 11,148,178
    • Issue date Oct 19, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Kohei Nonaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,131,682
    • Issue date Sep 28, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Masaki Hara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Clinical Analyzer
    • Patent number D846139
    • Issue date Apr 16, 2019
    • Hitachi High-Technologies Corporation
    • Ai Masuda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Clinical analyzer
    • Patent number D846140
    • Issue date Apr 16, 2019
    • Hitachi High-Technologies Corporation
    • Ai Masuda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Clinical analyzer
    • Patent number D846138
    • Issue date Apr 16, 2019
    • Hitachi High-Technologies Corporation
    • Ai Masuda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Clinical analyzer
    • Patent number D838382
    • Issue date Jan 15, 2019
    • Hitachi High-Technologies Corporation
    • Ai Masuda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Clinical analyzer
    • Patent number D838383
    • Issue date Jan 15, 2019
    • Hitachi High-Technologies Corporation
    • Ai Masuda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Automatic analysis apparatus and automatic analysis method
    • Patent number 8,997,589
    • Issue date Apr 7, 2015
    • Hitachi High-Technologies Corporation
    • Hidenobu Komatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,278,108
    • Issue date Oct 2, 2012
    • Hitachi High-Technologies Corporation
    • Kentaro Wada
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20250044311
    • Publication date Feb 6, 2025
    • Hitachi High-Tech Corporation
    • Kenshiro SAKATA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZING DEVICE, AND METHOD FOR DETERMINING SERVICE LIFE...
    • Publication number 20250035654
    • Publication date Jan 30, 2025
    • Hitachi High-Tech Corporation
    • Kumiko KAWATO
    • G01 - MEASURING TESTING
  • Information Patent Application

    CAMERA HOLDING DEVICE FOR AUTOMATIC ANALYSIS APPARATUS
    • Publication number 20250012826
    • Publication date Jan 9, 2025
    • Hitachi High-Tech Corporation
    • Manabu OCHI
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20240377424
    • Publication date Nov 14, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Yosuke HORIE
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20240369589
    • Publication date Nov 7, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Mami FUKUMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20240345110
    • Publication date Oct 17, 2024
    • Hitachi High-Tech Corporation
    • Hiromi Hirama
    • G01 - MEASURING TESTING
  • Information Patent Application

    IMAGING DEVICE
    • Publication number 20240284027
    • Publication date Aug 22, 2024
    • Hitachi High-Tech Corporation
    • Manabu OCHI
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    LED Light Source Device
    • Publication number 20240243243
    • Publication date Jul 18, 2024
    • Hitachi High-Tech Corporation
    • Hayato SHIMIZU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    AUTOMATIC CHEMICAL ANALYZER, AUTOMATIC CHEMICAL ANALYZER MAINTENANC...
    • Publication number 20240230693
    • Publication date Jul 11, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Hajime KATO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20240012018
    • Publication date Jan 11, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Hiroyuki TAKAYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20230324426
    • Publication date Oct 12, 2023
    • Hitachi High-Tech Corporation
    • Kohei NONAKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Chemical Analysis Apparatus and Electrical Impedance Spec...
    • Publication number 20230228783
    • Publication date Jul 20, 2023
    • Hitachi High-Tech Corporation
    • Hajime KATO
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTROLYTE ANALYSIS APPARATUS
    • Publication number 20230044702
    • Publication date Feb 9, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Yuichi Iwase
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    ELECTROLYTE ANALYSIS APPARATUS
    • Publication number 20230032886
    • Publication date Feb 2, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takahiro KUMAGAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220299539
    • Publication date Sep 22, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yosuke HORIE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20220120774
    • Publication date Apr 21, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Akinao FUJITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220034918
    • Publication date Feb 3, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yuichi IWASE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220034928
    • Publication date Feb 3, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yosuke HORIE
    • B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
  • Information Patent Application

    AUTOMATED ANALYSIS APPARATUS
    • Publication number 20220026387
    • Publication date Jan 27, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Masafumi MIYAKE
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTROLYTE ANALYZING DEVICE
    • Publication number 20210349052
    • Publication date Nov 11, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Masaki Hara
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20210341506
    • Publication date Nov 4, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Yoshiki MURAMATSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    ULTRASONIC CLEANER AND AUTOMATIC ANALYZER USING THE SAME
    • Publication number 20210323035
    • Publication date Oct 21, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Kohei NONAKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST METHOD AND DISPENSING DEVICE
    • Publication number 20210318344
    • Publication date Oct 14, 2021
    • Hitachi High-Tech Corporation
    • Akihiro Nojima
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTROLYTE ANALYZING DEVICE
    • Publication number 20210165009
    • Publication date Jun 3, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Takushi Miyakawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTROLYTE ANALYZING DEVICE
    • Publication number 20210025909
    • Publication date Jan 28, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Takushi Miyakawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20200386779
    • Publication date Dec 10, 2020
    • Hitachi High-Technologies Corporation
    • Tooru INABA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20200225254
    • Publication date Jul 16, 2020
    • Hitachi High-Technologies Corporation
    • Masaki HARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    NOZZLE CLEANER AND AUTOMATIC ANALYZER USING THE SAME
    • Publication number 20200009623
    • Publication date Jan 9, 2020
    • Hitachi High-Technologies Corporation
    • Takushi MIYAKAWA
    • B08 - CLEANING
  • Information Patent Application

    ULTRASONIC CLEANER AND AUTOMATIC ANALYZER USING THE SAME
    • Publication number 20200009619
    • Publication date Jan 9, 2020
    • Hitachi High-Technologies Corporation
    • Kohei NONAKA
    • B08 - CLEANING
  • Information Patent Application

    ULTRASONIC CLEANER AND AUTOMATIC ANALYZER USING THE SAME
    • Publication number 20190366391
    • Publication date Dec 5, 2019
    • Hitachi High-Technologies Corporation
    • Yosuke HORIE
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL