Tetsuji Onuki

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Shape measurement method and high-precision lens manufacturing process
- Patent number 5,986,760
- Issue date Nov 16, 1999
- Nikon Corporation
- Shigeru Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever and measuring apparatus using it
- Patent number 5,929,438
- Issue date Jul 27, 1999
- Nikon Corporation
- Yoshihiko Suzuki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 5,656,769
- Issue date Aug 12, 1997
- Nikon Corporation
- Katsushi Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe type microscope apparatus
- Patent number 5,508,517
- Issue date Apr 16, 1996
- Nikon Corporation
- Tetsuji Onuki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Compound type microscope
- Patent number 5,360,977
- Issue date Nov 1, 1994
- Nikon Corporation
- Tetsuji Onuki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 5,317,153
- Issue date May 31, 1994
- Nikon Corporation
- Hiroyuki Matsushiro
- B82 - NANO-TECHNOLOGY