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Tetsuji Watanabe
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Nirasaki City, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for thermal stabilization of probe card and inspection appar...
Patent number
9,030,218
Issue date
May 12, 2015
Tokyo Electron Limited
Kazunari Ishii
G01 - MEASURING TESTING
Information
Patent Grant
Needle trace transfer member and probe apparatus
Patent number
8,212,577
Issue date
Jul 3, 2012
Tokyo Electron Limited
Hiroshi Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Probe card inclination adjusting method, inclination detecting meth...
Patent number
8,030,955
Issue date
Oct 4, 2011
Tokyo Electron Limited
Hiroshi Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Alignment method, tip position detecting device and probe apparatus
Patent number
7,772,862
Issue date
Aug 10, 2010
Tokyo Electron Limited
Hiroshi Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Probe device and method of controlling the same
Patent number
5,034,684
Issue date
Jul 23, 1991
Tokyo Electron Limited
Kazuo Mitsui
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR THERMAL STABILIZATION OF PROBE CARD AND INSPECTION APPAR...
Publication number
20130278279
Publication date
Oct 24, 2013
TOKYO ELECTRON LIMITED
Kazunari Ishii
G01 - MEASURING TESTING
Information
Patent Application
ALIGNMENT METHOD, TIP POSITION DETECTING DEVICE AND PROBE APPARATUS
Publication number
20090251163
Publication date
Oct 8, 2009
TOKYO ELECTRON LIMITED
Hiroshi Yamada
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD INCLINATION ADJUSTING METHOD, INCLINATION DETECTING METH...
Publication number
20090219046
Publication date
Sep 3, 2009
TOKYO ELECTRON LIMITED
Hiroshi Yamada
G01 - MEASURING TESTING
Information
Patent Application
NEEDLE TRACE TRANSFER MEMBER AND PROBE APPARATUS
Publication number
20090212804
Publication date
Aug 27, 2009
TOKYO ELECTRON LIMITED
Hiroshi YAMADA
G01 - MEASURING TESTING