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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Thin section preparing apparatus and thin section preparing method
Patent number
8,166,855
Issue date
May 1, 2012
Seiko Instruments Inc.
Tetsumasa Ito
G01 - MEASURING TESTING
Information
Patent Grant
Automatic thin-section manufacturing system
Patent number
8,156,853
Issue date
Apr 17, 2012
Seiko Instruments, Inc.
Hirohito Fujiwara
G01 - MEASURING TESTING
Information
Patent Grant
Embedded block humidifier, automatic thin slice manufacturing devic...
Patent number
8,110,146
Issue date
Feb 7, 2012
Seiko Instruments Inc.
Tetsumasa Ito
G01 - MEASURING TESTING
Information
Patent Grant
Sectioning instrument
Patent number
8,087,334
Issue date
Jan 3, 2012
Seiko Instruments Inc.
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Grant
Automatic slicing apparatus
Patent number
8,074,547
Issue date
Dec 13, 2011
Seiko Instruments Inc.
Tetsumasa Ito
G01 - MEASURING TESTING
Information
Patent Grant
Automatic thin-section slides manufacturing system and method
Patent number
7,966,091
Issue date
Jun 21, 2011
Seiko Instruments Inc.
Koji Fujimoto
G01 - MEASURING TESTING
Information
Patent Grant
Thin-section conveyor apparatus, thin-section scooping tool, and me...
Patent number
7,866,464
Issue date
Jan 11, 2011
Seiko Instruments Inc.
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Grant
Automatic sliced piece fabricating apparatus and automatic sliced p...
Patent number
7,802,507
Issue date
Sep 28, 2010
Seiko Instruments Inc.
Tetsumasa Ito
G01 - MEASURING TESTING
Information
Patent Grant
Container for processing section samples, processing method for sec...
Patent number
7,616,302
Issue date
Nov 10, 2009
Seiko Instruments, Inc.
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Grant
Inductively coupled plasma mass spectrometric and spectrochemical a...
Patent number
6,002,129
Issue date
Dec 14, 1999
Seiko Instruments Inc.
Tetsumasa Ito
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma ion source mass spectrometer
Patent number
5,773,823
Issue date
Jun 30, 1998
Seiko Instruments Inc.
Tetsumasa Ito
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma ion source mass analyzing apparatus
Patent number
5,559,337
Issue date
Sep 24, 1996
Seiko Instruments Inc.
Tetsumasa Ito
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inductively coupled plasma mass spectrometer
Patent number
5,477,048
Issue date
Dec 19, 1995
Seiko Instruments Inc.
Yoshitomo Nakagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inductively coupled plasma mass spectrometry device
Patent number
5,334,834
Issue date
Aug 2, 1994
Seiko Instruments Inc.
Tetsumasa Ito
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
ICP mass spectrometer
Patent number
4,740,696
Issue date
Apr 26, 1988
Seiko Instruments & Electronics Ltd.
Takao Osawa
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
THIN SECTION PREPARING METHOD
Publication number
20120011975
Publication date
Jan 19, 2012
SEIKO INSTRUMENTS, INC.
Tetsumasa ITO
B26 - HAND CUTTING TOOLS CUTTING SEVERING
Information
Patent Application
THIN-SECTION SLIDES MANUFACTURING APPARATUS AND METHOD FOR MANUFACT...
Publication number
20100279342
Publication date
Nov 4, 2010
Yukimitsu KIJIMA
G01 - MEASURING TESTING
Information
Patent Application
Automatic Prepared Slide Fabricating Apparatus and Automatic Prepar...
Publication number
20100229702
Publication date
Sep 16, 2010
Koji Fujimoto
G01 - MEASURING TESTING
Information
Patent Application
Automatic Thin-Section Slides Manufacturing System and Automated Th...
Publication number
20100030364
Publication date
Feb 4, 2010
Koji Fujimoto
G01 - MEASURING TESTING
Information
Patent Application
THIN SECTION PREPARING APPARATUS AND THIN SECTION PREPARING METHOD
Publication number
20090133556
Publication date
May 28, 2009
Tetsumasa Ito
G01 - MEASURING TESTING
Information
Patent Application
EMBEDDED BLOCK HUMIDIFIER, AUTOMATIC THIN SLICE MANUFACTURING DEVIC...
Publication number
20090137028
Publication date
May 28, 2009
Tetsumasa Ito
G01 - MEASURING TESTING
Information
Patent Application
THIN SECTION PREPARING APPARATUS AND THIN SECTION PREPARING METHOD
Publication number
20090133561
Publication date
May 28, 2009
Tetsumasa Ito
B26 - HAND CUTTING TOOLS CUTTING SEVERING
Information
Patent Application
AUTOMATIC THIN-SECTION MANUFACTURING SYSTEM
Publication number
20080202308
Publication date
Aug 28, 2008
Hirohito Fujiwara
G01 - MEASURING TESTING
Information
Patent Application
Container for Processing Section Samples, Processing Method for Sec...
Publication number
20080088834
Publication date
Apr 17, 2008
Tatsuya Miyatani
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Embedding cassette
Publication number
20080044315
Publication date
Feb 21, 2008
Koji Fujimoto
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
THIN-SECTION CONVEYOR APPARATUS, THIN-SECTION SCOOPING TOOL, AND ME...
Publication number
20080044260
Publication date
Feb 21, 2008
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Application
Identification code labeling tape
Publication number
20080044649
Publication date
Feb 21, 2008
SEIKO INSTRUMENTS INC.
Koji Fujimoto
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
Automatic sliced piece fabricating apparatus and automatic sliced p...
Publication number
20070204734
Publication date
Sep 6, 2007
Tetsumasa Ito
G01 - MEASURING TESTING
Information
Patent Application
Automatic instrument for fabricating prepared slide of tissue secti...
Publication number
20070204740
Publication date
Sep 6, 2007
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Application
Instrument for fabricating prepared slide of tissue section and sec...
Publication number
20070199418
Publication date
Aug 30, 2007
Tetsumasa Ito
B26 - HAND CUTTING TOOLS CUTTING SEVERING
Information
Patent Application
Automatic slicing apparatus
Publication number
20070180965
Publication date
Aug 9, 2007
Tetsumasa Ito
G01 - MEASURING TESTING
Information
Patent Application
Sectioning instrument
Publication number
20070157786
Publication date
Jul 12, 2007
Tatsuya Miyatani
G01 - MEASURING TESTING