Tetsuo Abe

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Testing apparatus using scanning electron microscope
- Patent number 6,953,939
- Issue date Oct 11, 2005
- Sony Corporation
- Tetsuo Abe
- G01 - MEASURING TESTING
Information Patent Grant
Polysilicon evaluating method, polysilicon inspection apparatus and...
- Patent number 6,933,185
- Issue date Aug 23, 2005
- Sony Corporation
- Hiroyuki Wada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for evaluating polysilicon film
- Patent number 6,798,498
- Issue date Sep 28, 2004
- Sony Corporation
- Hiroyuki Wada
- G01 - MEASURING TESTING
Information Patent Grant
IC package inspection apparatus
- Patent number 5,473,425
- Issue date Dec 5, 1995
- Sony Corporation
- Tomohide Tokumaru
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Inspection device using scanning electron microscope
- Publication number 20040144928
- Publication date Jul 29, 2004
- Tetsuo Abe
- G01 - MEASURING TESTING
Information Patent Application
Polysilicon evaluating method, polysilicon inspection apparatus and...
- Publication number 20030183853
- Publication date Oct 2, 2003
- Hiroyuki Wada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for evaluating polysilicon film
- Publication number 20020145733
- Publication date Oct 10, 2002
- SONY CORPORATION
- Hiroyuki Wada
- G01 - MEASURING TESTING
Information Patent Application
Polysilicon evaluating method, polysilicon inspection apparatus and...
- Publication number 20010038105
- Publication date Nov 8, 2001
- Hiroyuki Wada
- H01 - BASIC ELECTRIC ELEMENTS