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Tetsuo Hadeishi
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Kensington, CA, US
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last 30 patents
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Patent Grant
Spark-excited fluorescence sensor
Patent number
5,333,487
Issue date
Aug 2, 1994
Hughes Aircraft Company
Hiroshi Kimura
G01 - MEASURING TESTING
Information
Patent Grant
High stability high intensity atomic emission light source
Patent number
4,941,743
Issue date
Jul 17, 1990
Gruen Optik Wetzlar GmbH
Tetsuo Hadeishi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process and device for the generation of a linearly dependent measu...
Patent number
4,815,847
Issue date
Mar 28, 1989
Gruen Optik Wetzlar GmbH
Wolfgang Oberheim
G01 - MEASURING TESTING
Information
Patent Grant
Device for the individual adjustment of the intensity of several sp...
Patent number
4,815,848
Issue date
Mar 28, 1989
Gruen Optik Wetzlar GmbH
Tetsuo Hadeishi
G01 - MEASURING TESTING