Tetsuo Hata

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Movement amount operation correction method for prober, movement am...
- Patent number 7,501,843
- Issue date Mar 10, 2009
- Tokyo Seimitsu Co., Ltd.
- Masatomo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Prober and probe contact method
- Patent number 7,405,584
- Issue date Jul 29, 2008
- Tokyo Seimitsu Co., Ltd.
- Taichi Fujita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
STRAIN MEASURING SYSTEM
- Publication number 20240302226
- Publication date Sep 12, 2024
- TDK Corporation
- Tetsuya SASAHARA
- G01 - MEASURING TESTING
Information Patent Application
STRAIN RESISTANCE FILM, PHYSICAL QUANTITY SENSOR, AND METHOD FOR MA...
- Publication number 20240117474
- Publication date Apr 11, 2024
- TDK Corporation
- Kohei NAWAOKA
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
SENSOR MEMBER
- Publication number 20240068891
- Publication date Feb 29, 2024
- TDK Corporation
- Masanori KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SENSOR MEMBER AND PHYSICAL QUANTITY SENSOR
- Publication number 20240068897
- Publication date Feb 29, 2024
- TDK Corporation
- Masanori KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
PROBER AND PROBE CONTACT METHOD
- Publication number 20070268033
- Publication date Nov 22, 2007
- Taichi Fujita
- G01 - MEASURING TESTING
Information Patent Application
Movement amount operation correction method for prober, movement am...
- Publication number 20060267613
- Publication date Nov 30, 2006
- Masatomo Takahashi
- G01 - MEASURING TESTING