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Tetsuo Hoki
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Kyoto, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Pattern defect detection apparatus
Patent number
5,774,574
Issue date
Jun 30, 1998
Dainippon Screen Mfg. Co., Ltd.
Tetsuo Hoki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of and apparatus for inspecting the minimum annular width of...
Patent number
5,408,538
Issue date
Apr 18, 1995
Dainippon Screen Mfg. Co., Ltd.
Ryuji Kitakado
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of and device for determining positioning between a hole and...
Patent number
5,347,591
Issue date
Sep 13, 1994
Dainippon Screen Mfg. Co., Ltd.
Hiroyuki Onishi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of and apparatus for inspecting wiring pattern on printed board
Patent number
5,272,762
Issue date
Dec 21, 1993
Dainippon Screen Mfg. Co., Ltd.
Yoshinori Sezaki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of reading optical image of inspected surface and image read...
Patent number
5,197,105
Issue date
Mar 23, 1993
Dainippon Screen Mfg. Co. Ltd.
Haruo Uemura
G01 - MEASURING TESTING
Information
Patent Grant
Method of and device for inspecting pattern of printed circuit board
Patent number
5,161,202
Issue date
Nov 3, 1992
Dainippon Screen Mfg. Co. Ltd.
Ryuji Kitakado
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of and device for inspecting pattern of printed circuit board
Patent number
5,150,423
Issue date
Sep 22, 1992
Dainippon Screen Mfg. Co. Ltd.
Tetsuo Hoki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of and apparatus for inspecting conductive pattern on printe...
Patent number
5,150,422
Issue date
Sep 22, 1992
Dainippon Screen Mfg. Co., Ltd.
Ryuji Kitakado
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of and apparatus for inspecting conductive pattern on printe...
Patent number
5,144,681
Issue date
Sep 1, 1992
Dainnippon Screen Mfg. Co., Ltd.
Ryuji Kitakado
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of and apparatus for detecting pattern defects by means of a...
Patent number
5,046,113
Issue date
Sep 3, 1991
Dainippon Screen Mfg. Co. Ltd.
Tetsuo Hoki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of and apparatus for inspecting conductive pattern on printe...
Patent number
5,027,417
Issue date
Jun 25, 1991
Dainippon Screen Mfg. Co., Ltd.
Ryuji Kitakado
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of and apparatus for detecting pattern defects
Patent number
4,803,734
Issue date
Feb 7, 1989
Dainippon Screen Mfg. Co., Ltd.
Hiroyuki Onishi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pattern masking method and an apparatus therefor
Patent number
4,797,939
Issue date
Jan 10, 1989
Dainippon Screen Mfg. Co., Ltd.
Tetsuo Hoki
G06 - COMPUTING CALCULATING COUNTING