Tetsuo Ishiguro

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Sayama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and its test method
- Patent number 7,982,217
- Issue date Jul 19, 2011
- Renesas Electronics Corporation
- Norihiko Sugita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device and its test method
- Publication number 20080237592
- Publication date Oct 2, 2008
- RENESAS TECHNOLOGY CORP.
- Norihiko Sugita
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and its test method
- Publication number 20050099199
- Publication date May 12, 2005
- Norihiko Sugita
- G01 - MEASURING TESTING