Tetsuo Kato

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory device with improved data propagation characte...
- Patent number 6,496,441
- Issue date Dec 17, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Takashi Kono
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device capable of adjusting internal parameter
- Patent number 6,424,593
- Issue date Jul 23, 2002
- Mitsubishi Denki Kaubushiki Kaisha
- Shigehiro Kuge
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device operable in a plurality of test operation modes
- Patent number 6,424,142
- Issue date Jul 23, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and method of checking same for defect
- Patent number 6,400,621
- Issue date Jun 4, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hideto Hidaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device operable in a plurality of test operation modes
- Patent number 6,333,879
- Issue date Dec 25, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having a test mode setting circuit
- Patent number 6,327,198
- Issue date Dec 4, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device tested in batches
- Patent number 6,317,368
- Issue date Nov 13, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Yasuhiko Taito
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and method of checking same for defect
- Patent number 6,301,163
- Issue date Oct 9, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Hideto Hidaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having test function
- Patent number 6,288,956
- Issue date Sep 11, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and method of checking same for defect
- Patent number 5,999,464
- Issue date Dec 7, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Hideto Hidaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having a refresh-cycle program circuit
- Patent number 5,970,507
- Issue date Oct 19, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Mode setting circuit of semiconductor device
- Patent number 5,898,316
- Issue date Apr 27, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and method of checking same for defect
- Patent number 5,764,576
- Issue date Jun 9, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Hideto Hidaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory with internal testing switches
- Patent number 5,557,571
- Issue date Sep 17, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Kato
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor memory device with improved data propagation characte...
- Publication number 20020105849
- Publication date Aug 8, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Takashi Kono
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device operable in a plurality of test operation modes
- Publication number 20020034112
- Publication date Mar 21, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Kato
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE CAPABLE OF ADJUSTING INTERNAL PARAMETER
- Publication number 20020031041
- Publication date Mar 14, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Shigehiro Kuge
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device and method of checking same for defect
- Publication number 20020006064
- Publication date Jan 17, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hideto Hidaka
- G11 - INFORMATION STORAGE

Tetsuo Kato

Person

Patents Grantslast 30 patents

Semiconductor memory device with improved data propagation characte...

Semiconductor memory device capable of adjusting internal parameter

Semiconductor device operable in a plurality of test operation modes

Semiconductor memory device and method of checking same for defect

Semiconductor device operable in a plurality of test operation modes

Semiconductor memory device having a test mode setting circuit

Semiconductor integrated circuit device tested in batches

Semiconductor memory device and method of checking same for defect

Semiconductor device having test function

Semiconductor memory device and method of checking same for defect

Semiconductor memory device having a refresh-cycle program circuit

Mode setting circuit of semiconductor device

Semiconductor memory device and method of checking same for defect

Dynamic random access memory with internal testing switches

Patents Applicationslast 30 patents

Semiconductor memory device with improved data propagation characte...

Semiconductor device operable in a plurality of test operation modes

SEMICONDUCTOR MEMORY DEVICE CAPABLE OF ADJUSTING INTERNAL PARAMETER

Semiconductor memory device and method of checking same for defect