Tetsuo Oikawa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and combined illumination lens
- Patent number 7,601,957
- Issue date Oct 13, 2009
- National University Corporation Kyoto Institute of Technology
- Hisamitsu Endoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope equipped with magnetic microprobe
- Patent number 7,241,995
- Issue date Jul 10, 2007
- TOHOKU UNIVERSITY
- Daisuke Shindo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dispenser for dispensing sheets of an alternating first and second...
- Patent number 5,067,702
- Issue date Nov 26, 1991
- Jeol Ltd.
- Katsuaki Muraishi
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Electron microscope image recording and read-out method
- Patent number 5,006,707
- Issue date Apr 9, 1991
- Fuji Photo Film Co., Ltd.
- Nobufumi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope which prevents undesired X-ray exposure
- Patent number 4,977,321
- Issue date Dec 11, 1990
- Fuji Photo Film Co., Ltd.
- Nobufumi Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magazine for accommodating recording medium for electron microscope
- Patent number 4,928,016
- Issue date May 22, 1990
- Fuji Photo Film Co. Ltd.
- Nobufumi Mori
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron microscope image output method and apparatus
- Patent number 4,873,440
- Issue date Oct 10, 1989
- Fuji Photo Film Co., Ltd.
- Nobufumi Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 4,810,886
- Issue date Mar 7, 1989
- Fuji Photo Film Co., Ltd.
- Nobufumi Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission-type electron microscope
- Patent number 4,801,801
- Issue date Jan 31, 1989
- Fuji Photo Film Co., Ltd.
- Nobufumi Mori
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope and Combined Illumination Lens
- Publication number 20080149833
- Publication date Jun 26, 2008
- Hisamitsu Endoh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Electron microscope equipped with magnetic microprobe
- Publication number 20050274889
- Publication date Dec 15, 2005
- TOHOKU UNIVERSITY
- Daisuke Shindo
- H01 - BASIC ELECTRIC ELEMENTS

Tetsuo Oikawa

Person

Patents Grantslast 30 patents

Electron microscope and combined illumination lens

Electron microscope equipped with magnetic microprobe

Dispenser for dispensing sheets of an alternating first and second...

Electron microscope image recording and read-out method

Electron microscope which prevents undesired X-ray exposure

Magazine for accommodating recording medium for electron microscope

Electron microscope image output method and apparatus

Electron microscope

Transmission-type electron microscope

Patents Applicationslast 30 patents

Electron Microscope and Combined Illumination Lens

Electron microscope equipped with magnetic microprobe