Tetsuo Tada

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device with identification function
- Patent number 5,894,172
- Issue date Apr 13, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Masahiko Hyozo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for testing semiconductor device
- Patent number 5,436,559
- Issue date Jul 25, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Ryoichi Takagi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing semiconductor device
- Patent number 5,266,894
- Issue date Nov 30, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Ryoichi Takagi
- G01 - MEASURING TESTING
Information Patent Grant
Probe plate used for testing a semiconductor device, and a test app...
- Patent number 5,055,780
- Issue date Oct 8, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Ryouichi Takagi
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a probing card for wafer testing
- Patent number 5,042,148
- Issue date Aug 27, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Tada
- G01 - MEASURING TESTING
Information Patent Grant
Probing card for wafer testing and method of manufacturing the same
- Patent number 4,983,908
- Issue date Jan 8, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Tada
- G01 - MEASURING TESTING
Information Patent Grant
Probing plate for wafer testing
- Patent number 4,961,052
- Issue date Oct 2, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Tada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test system
- Patent number 4,888,715
- Issue date Dec 19, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Tada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test assist circuit for a semiconductor device providing fault isol...
- Patent number 4,873,686
- Issue date Oct 10, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Tada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor test device
- Patent number 4,813,043
- Issue date Mar 14, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Hideshi Maeno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device tester
- Patent number 4,807,229
- Issue date Feb 21, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Tada
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for semiconductor device
- Patent number 4,801,871
- Issue date Jan 31, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Tada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing device
- Patent number 4,799,009
- Issue date Jan 17, 1989
- Vlsi Technology Research Association
- Tetsuo Tada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing device
- Patent number 4,720,671
- Issue date Jan 19, 1988
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Tada
- G01 - MEASURING TESTING

Tetsuo Tada

Person

Patents Grantslast 30 patents

Semiconductor device with identification function

Method for testing semiconductor device

Apparatus and method for testing semiconductor device

Probe plate used for testing a semiconductor device, and a test app...

Method of manufacturing a probing card for wafer testing

Probing card for wafer testing and method of manufacturing the same

Probing plate for wafer testing

Semiconductor test system

Test assist circuit for a semiconductor device providing fault isol...

Semiconductor test device

Semiconductor device tester

Testing apparatus for semiconductor device

Semiconductor testing device

Semiconductor device testing device