Tetsuo Yoshida

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Prober controlling device, prober controlling method, and prober
- Patent number 12,007,413
- Issue date Jun 11, 2024
- Tokyo Seimitsu Co., Ltd.
- Tetsuo Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Particle measurement device, three-dimensional shape measurement de...
- Patent number 11,940,463
- Issue date Mar 26, 2024
- Tokyo Seimitsu Co., Ltd.
- Natsumi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection method
- Patent number 10,481,177
- Issue date Nov 19, 2019
- Tokyo Seimitsu Co. Ltd.
- Yuichi Ozawa
- G01 - MEASURING TESTING
Information Patent Grant
Probing device for electronic device and probing method
- Patent number 9,983,256
- Issue date May 29, 2018
- Tokyo Seimitsu Co. Ltd.
- Yuichi Ozawa
- G01 - MEASURING TESTING
Information Patent Grant
Oscillation type electromagnetic power generator and method for man...
- Patent number 8,115,350
- Issue date Feb 14, 2012
- Sumida Corporation
- Tetsuo Yoshida
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Coil component
- Patent number 8,093,978
- Issue date Jan 10, 2012
- Sumida Corporation
- Mitsugu Kawarai
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Video communication apparatus capable of electronically adjusting t...
- Patent number 4,996,592
- Issue date Feb 26, 1991
- Oki Electric Industry Co., Ltd.
- Tetsuo Yoshida
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
PROBER CONTROLLING DEVICE, PROBER CONTROLLING METHOD, AND PROBER
- Publication number 20240094254
- Publication date Mar 21, 2024
- TOKYO SEIMITSU CO., LTD.
- Tetsuo YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE MEASUREMENT DEVICE, THREE-DIMENSIONAL SHAPE MEASUREMENT DE...
- Publication number 20230417797
- Publication date Dec 28, 2023
- TOKYO SEIMITSU CO., LTD.
- Natsumi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION METHOD
- Publication number 20170322236
- Publication date Nov 9, 2017
- TOKYO SEIMITSU CO., LTD.
- Yuichi Ozawa
- G01 - MEASURING TESTING
Information Patent Application
PROBING DEVICE FOR ELECTRONIC DEVICE AND PROBING METHOD
- Publication number 20150109625
- Publication date Apr 23, 2015
- TOKYO SEIMITSU CO., LTD.
- Yuichi Ozawa
- G01 - MEASURING TESTING
Information Patent Application
COIL COMPONENT
- Publication number 20110234351
- Publication date Sep 29, 2011
- Sumida Corporation
- Mitsugu KAWARAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OSCILLATION TYPE ELECTROMAGNETIC POWER GENERATOR AND METHOD FOR MAN...
- Publication number 20100084928
- Publication date Apr 8, 2010
- SUMIDA CORPORATION
- Tetsuo Yoshida
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Tetsuo Yoshida

Person

Patents Grantslast 30 patents

Prober controlling device, prober controlling method, and prober

Particle measurement device, three-dimensional shape measurement de...

Wafer inspection method

Probing device for electronic device and probing method

Oscillation type electromagnetic power generator and method for man...

Coil component

Video communication apparatus capable of electronically adjusting t...

Patents Applicationslast 30 patents

PROBER CONTROLLING DEVICE, PROBER CONTROLLING METHOD, AND PROBER

PARTICLE MEASUREMENT DEVICE, THREE-DIMENSIONAL SHAPE MEASUREMENT DE...

WAFER INSPECTION METHOD

PROBING DEVICE FOR ELECTRONIC DEVICE AND PROBING METHOD

COIL COMPONENT

OSCILLATION TYPE ELECTROMAGNETIC POWER GENERATOR AND METHOD FOR MAN...