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Tetsuro Kiriyama
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Kawasaki-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Encoder having phase adjuster for offsetting phases of multi-phase...
Patent number
10,003,321
Issue date
Jun 19, 2018
Mitutoyo Corporation
Tetsuro Kiriyama
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Photoelectric encoder capable of effectively removing harmonic comp...
Patent number
7,485,845
Issue date
Feb 3, 2009
Mitutoyo Corporation
Toru Yaku
G01 - MEASURING TESTING
Information
Patent Grant
Method and circuit for interpolating encoder output
Patent number
7,352,305
Issue date
Apr 1, 2008
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectric encoder using an incoherent semiconductor light source
Patent number
7,265,338
Issue date
Sep 4, 2007
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Encoder output signal correction apparatus and method
Patent number
7,250,881
Issue date
Jul 31, 2007
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Encoder output signal correction apparatus and method
Patent number
7,109,900
Issue date
Sep 19, 2006
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Position measuring device and error detecting method for the same,...
Patent number
6,636,035
Issue date
Oct 21, 2003
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Optical encoder and method of fabricating its sensor head
Patent number
6,621,068
Issue date
Sep 16, 2003
Mitutoyo Corporation
Toshihiko Aoki
G01 - MEASURING TESTING
Information
Patent Grant
Relative-displacement detecting unit and relative-displacement dete...
Patent number
6,597,167
Issue date
Jul 22, 2003
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Grant
Displacement detecting device power supply and data communication d...
Patent number
6,573,707
Issue date
Jun 3, 2003
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Induction type transducer and electronic caliper
Patent number
6,522,129
Issue date
Feb 18, 2003
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Grant
Interpolation circuit for encoder having a look-up table memory wit...
Patent number
5,999,113
Issue date
Dec 7, 1999
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic encoder using a displacement detecting circuit thereof
Patent number
5,949,051
Issue date
Sep 7, 1999
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Interpolation circuit for encoder
Patent number
5,907,298
Issue date
May 25, 1999
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Data output encoder having resetting mechanism
Patent number
5,485,468
Issue date
Jan 16, 1996
Mitutoyo Corporation
Tetsuro Kiriyama
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
PHASE ADJUSTER AND ENCODER
Publication number
20160294364
Publication date
Oct 6, 2016
MITUTOYO CORPORATION
Tetsuro KIRIYAMA
G01 - MEASURING TESTING
Information
Patent Application
PHOTOELECTRIC ENCODER
Publication number
20070125939
Publication date
Jun 7, 2007
Mitutoyo Corporation
Toru Yaku
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND CIRCUIT FOR INTERPOLATING ENCODER OUTPUT
Publication number
20070035417
Publication date
Feb 15, 2007
Mitutoyo Corporation
Tetsuro Kiriyama
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Photoelectric encoder
Publication number
20060097141
Publication date
May 11, 2006
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Application
Encoder output signal correction apparatus and method
Publication number
20060076480
Publication date
Apr 13, 2006
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Application
Encoder output signal correction apparatus and method
Publication number
20060077083
Publication date
Apr 13, 2006
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Application
Position measuring device and error detecting method for the same,...
Publication number
20020030484
Publication date
Mar 14, 2002
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Application
Displacement detecting device
Publication number
20020024335
Publication date
Feb 28, 2002
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Application
Induction type transducer and electronic caliper
Publication number
20020011838
Publication date
Jan 31, 2002
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Application
Relative-displacement detecting unit and relative-displacement dete...
Publication number
20020011839
Publication date
Jan 31, 2002
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Application
Optical encoder and method of fabricating its sensor head
Publication number
20020008195
Publication date
Jan 24, 2002
Mitutoyo Corporation
Toshihiko Aoki
G01 - MEASURING TESTING