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Tetsuro Kiriyama
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Kawasaki-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Encoder having phase adjuster for offsetting phases of multi-phase...
Patent number
10,003,321
Issue date
Jun 19, 2018
Mitutoyo Corporation
Tetsuro Kiriyama
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Photoelectric encoder capable of effectively removing harmonic comp...
Patent number
7,485,845
Issue date
Feb 3, 2009
Mitutoyo Corporation
Toru Yaku
G01 - MEASURING TESTING
Information
Patent Grant
Method and circuit for interpolating encoder output
Patent number
7,352,305
Issue date
Apr 1, 2008
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectric encoder using an incoherent semiconductor light source
Patent number
7,265,338
Issue date
Sep 4, 2007
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Encoder output signal correction apparatus and method
Patent number
7,250,881
Issue date
Jul 31, 2007
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Encoder output signal correction apparatus and method
Patent number
7,109,900
Issue date
Sep 19, 2006
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Position measuring device and error detecting method for the same,...
Patent number
6,636,035
Issue date
Oct 21, 2003
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Optical encoder and method of fabricating its sensor head
Patent number
6,621,068
Issue date
Sep 16, 2003
Mitutoyo Corporation
Toshihiko Aoki
G01 - MEASURING TESTING
Information
Patent Grant
Relative-displacement detecting unit and relative-displacement dete...
Patent number
6,597,167
Issue date
Jul 22, 2003
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Grant
Displacement detecting device power supply and data communication d...
Patent number
6,573,707
Issue date
Jun 3, 2003
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Induction type transducer and electronic caliper
Patent number
6,522,129
Issue date
Feb 18, 2003
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Grant
Interpolation circuit for encoder having a look-up table memory wit...
Patent number
5,999,113
Issue date
Dec 7, 1999
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic encoder using a displacement detecting circuit thereof
Patent number
5,949,051
Issue date
Sep 7, 1999
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Interpolation circuit for encoder
Patent number
5,907,298
Issue date
May 25, 1999
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Data output encoder having resetting mechanism
Patent number
5,485,468
Issue date
Jan 16, 1996
Mitutoyo Corporation
Tetsuro Kiriyama
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
CORRECTION VALUE CALCULATION METHOD, CORRECTION VALUE CALCULATION P...
Publication number
20250023583
Publication date
Jan 16, 2025
Mitutoyo Corporation
Tetsuro Kiriyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PHASE ADJUSTER AND ENCODER
Publication number
20160294364
Publication date
Oct 6, 2016
MITUTOYO CORPORATION
Tetsuro KIRIYAMA
G01 - MEASURING TESTING
Information
Patent Application
PHOTOELECTRIC ENCODER
Publication number
20070125939
Publication date
Jun 7, 2007
Mitutoyo Corporation
Toru Yaku
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND CIRCUIT FOR INTERPOLATING ENCODER OUTPUT
Publication number
20070035417
Publication date
Feb 15, 2007
Mitutoyo Corporation
Tetsuro Kiriyama
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Photoelectric encoder
Publication number
20060097141
Publication date
May 11, 2006
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Application
Encoder output signal correction apparatus and method
Publication number
20060076480
Publication date
Apr 13, 2006
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Application
Encoder output signal correction apparatus and method
Publication number
20060077083
Publication date
Apr 13, 2006
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Application
Position measuring device and error detecting method for the same,...
Publication number
20020030484
Publication date
Mar 14, 2002
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Application
Displacement detecting device
Publication number
20020024335
Publication date
Feb 28, 2002
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Application
Induction type transducer and electronic caliper
Publication number
20020011838
Publication date
Jan 31, 2002
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Application
Relative-displacement detecting unit and relative-displacement dete...
Publication number
20020011839
Publication date
Jan 31, 2002
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Application
Optical encoder and method of fabricating its sensor head
Publication number
20020008195
Publication date
Jan 24, 2002
Mitutoyo Corporation
Toshihiko Aoki
G01 - MEASURING TESTING