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Kawasaki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method of testing a semiconductor device and suctioning a semicondu...
Patent number
8,759,119
Issue date
Jun 24, 2014
Fujitsu Semiconductor Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Method of testing a semiconductor device and suctioning a semicondu...
Patent number
8,404,496
Issue date
Mar 26, 2013
Fujitsu Semiconductor Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device having an alignment mark formed by the same ma...
Patent number
7,112,889
Issue date
Sep 26, 2006
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Method for manufacturing multi-kind and small quantity semiconducto...
Patent number
7,062,346
Issue date
Jun 13, 2006
Fujitsu Limited
Osamu Takagi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for manufacturing multi-kind and small quantity semiconducto...
Patent number
6,862,725
Issue date
Mar 1, 2005
Fujitsu Limited
Osamu Takagi
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
METHOD OF TESTING A SEMICONDUCTOR DEVICE AND SUCTIONING A SEMICONDU...
Publication number
20130171748
Publication date
Jul 4, 2013
FUJITSU SEMICONDUCTOR LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device having an alignment mark formed by the same ma...
Publication number
20060279003
Publication date
Dec 14, 2006
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Method for manufacturing multi-kind and small quantity semiconducto...
Publication number
20040225385
Publication date
Nov 11, 2004
FUJITSU LIMITED
Osamu Takagi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for manufacturing multi-kind and small quantity semiconducto...
Publication number
20020017708
Publication date
Feb 14, 2002
FUJITSU LIMITED
Osamu Takagi
G06 - COMPUTING CALCULATING COUNTING