Tetsuya Akashi

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Fujimi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Interferometer
- Patent number 7,872,755
- Issue date Jan 18, 2011
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Electron interferometer or electron microscope
- Patent number 7,816,648
- Issue date Oct 19, 2010
- Riken
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometer having three electron biprisms
- Patent number 7,750,298
- Issue date Jul 6, 2010
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam equipment
- Patent number 7,655,905
- Issue date Feb 2, 2010
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer
- Patent number 7,538,323
- Issue date May 26, 2009
- Riken
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Interferometer
- Publication number 20090273789
- Publication date Nov 5, 2009
- Riken
- Ken Harada
- G02 - OPTICS
Information Patent Application
Charged particle beam equipment
- Publication number 20090045339
- Publication date Feb 19, 2009
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Application
Electron Interferometer or Electron Microscope
- Publication number 20080302965
- Publication date Dec 11, 2008
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Interferometer
- Publication number 20080258058
- Publication date Oct 23, 2008
- Ken Harada
- G02 - OPTICS