Tetsuya AKASHI

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Interferometric electron microscope
- Patent number 11,011,344
- Issue date May 18, 2021
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holding mechanism, manufacturing method for same, and charge...
- Patent number 10,872,743
- Issue date Dec 22, 2020
- Hitachi, Ltd.
- Akira Sugawara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron microscope for magnetic field measurement and magnetic fie...
- Patent number 10,629,410
- Issue date Apr 21, 2020
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PHASE IMAGE PROCESSING APPARATUS AND PHASE IMAGE PROCESSING METHOD
- Publication number 20240021406
- Publication date Jan 18, 2024
- Hitachi, Ltd
- Yoshio TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE COLLECTION SYSTEM
- Publication number 20210110992
- Publication date Apr 15, 2021
- Hitachi, Ltd
- Yoshio TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFEROMETRIC ELECTRON MICROSCOPE
- Publication number 20200273657
- Publication date Aug 27, 2020
- Hitachi, Ltd
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE FOR MAGNETIC FIELD MEASUREMENT AND MAGNETIC FIE...
- Publication number 20190295817
- Publication date Sep 26, 2019
- Hitachi, Ltd
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDING MECHANISM, MANUFACTURING METHOD FOR SAME, AND CHARGE...
- Publication number 20190027338
- Publication date Jan 24, 2019
- Hitachi, Ltd
- Akira SUGAWARA
- H01 - BASIC ELECTRIC ELEMENTS