Tetsuya Baba

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Ibaraki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Thermo-physical property measurement instrument and thermo-physical...
- Patent number 11,867,567
- Issue date Jan 9, 2024
- NETZSCH Japan K.K.
- Yohei Kakefuda
- G01 - MEASURING TESTING
Information Patent Grant
Physical property value measurement device, physical property value...
- Patent number 11,175,249
- Issue date Nov 16, 2021
- NETZSCH Japan K.K.
- Takahiro Baba
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring thermophysical properties
- Patent number 7,407,325
- Issue date Aug 5, 2008
- National Institute of Advanced Industrial Science and Technology
- Hiromichi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring fast time response using fast pulse and system...
- Patent number 7,044,636
- Issue date May 16, 2006
- National Institute of Advanced Industrial Science and Technology
- Naoyuki Taketoshi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring thermophysical properties
- Patent number 6,595,685
- Issue date Jul 22, 2003
- National Research Laboratory of Metrology
- Tetsuya Baba
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring thermal diffusivity and interface thermal resi...
- Patent number 6,592,252
- Issue date Jul 15, 2003
- National Institute of Advanced Industrial Science and Technology
- Tetsuya Baba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Thermophysical Property Value Measurement Device And Thermophysical...
- Publication number 20220316959
- Publication date Oct 6, 2022
- Yohei Kakefuda
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL PROPERTY VALUE MEASUREMENT DEVICE, PHYSICAL PROPERTY VALUE...
- Publication number 20210080415
- Publication date Mar 18, 2021
- PicoTherm Corporation
- Takahiro BABA
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring thermophysical properties
- Publication number 20060039443
- Publication date Feb 23, 2006
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Hiromichi Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring thermophysical property of thin film and appar...
- Publication number 20050002436
- Publication date Jan 6, 2005
- Naoyuki Taketoshi
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring fast time response using fast pulse and system...
- Publication number 20030202556
- Publication date Oct 30, 2003
- Naoyuki Taketoshi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING THERMOPHYSICAL PROPERTIES
- Publication number 20020131476
- Publication date Sep 19, 2002
- TETSUYA BABA
- G01 - MEASURING TESTING