Tetsuya Gatayama

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Ion selective electrode and flow type ion sensor using the same
- Patent number 4,758,325
- Issue date Jul 19, 1988
- Kabushiki Kaisha Toshiba
- Ken-ichi Kanno
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring halogen ion concentration
- Patent number 4,619,739
- Issue date Oct 28, 1986
- Kabushiki Kaisha Toshiba
- Ken-ichi Kanno
- G01 - MEASURING TESTING
Information Patent Grant
Regeneration method of ion-selective electrode, and ion-selective e...
- Patent number 4,409,088
- Issue date Oct 11, 1983
- Tokyo Shibaura Denki Kabushiki Kaisha
- Ken-ichi Kanno
- G01 - MEASURING TESTING