Membership
Tour
Register
Log in
Tetsuya IWABUCHI
Follow
Person
Aomori, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for testing integrated circuit
Patent number
8,680,880
Issue date
Mar 25, 2014
Kabushiki Kaisha Nihon Micronics
Hidehiro Kiyofuji
G01 - MEASURING TESTING
Information
Patent Grant
Probe for electrical test comprising a positioning mark and probe a...
Patent number
7,602,200
Issue date
Oct 13, 2009
Kabushiki Kaisha Nihon Micronics
Yuji Miyagi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR TESTING INTEGRATED CIRCUIT
Publication number
20100164520
Publication date
Jul 1, 2010
Kabushiki Kaisha Nihon Micronics
Hidehiro KIYOFUJI
G01 - MEASURING TESTING
Information
Patent Application
Probe for Electrical Test and Probe Assembly
Publication number
20090009201
Publication date
Jan 8, 2009
Kabushiki Kaisha Nihon Micronics
Yuji Miyagi
G01 - MEASURING TESTING
Information
Patent Application
CLEANING APPARATUS FOR A PROBE
Publication number
20080280542
Publication date
Nov 13, 2008
KABUSHIKI KAISHA NIHON MICRONICS
Yuji Miyagi
B24 - GRINDING POLISHING