Tetsuya KAGAMI

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Yamanashi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Testing system
- Patent number 11,454,664
- Issue date Sep 27, 2022
- Tokyo Electron Limited
- Kentaro Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and malfunction analysis/prediction method for in...
- Patent number 11,187,747
- Issue date Nov 30, 2021
- Tokyo Electron Limited
- Tetsuya Kagami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system, wafer map display, wafer map display method, and...
- Patent number 11,009,544
- Issue date May 18, 2021
- Tokyo Electron Limited
- Shin Uchida
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system
- Patent number 10,871,516
- Issue date Dec 22, 2020
- Tokyo Electron Limited
- Tetsuya Kagami
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TESTING SYSTEM AND TESTING METHOD
- Publication number 20210364550
- Publication date Nov 25, 2021
- TOKYO ELECTRON LIMITED
- Tetsuya KAGAMI
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM
- Publication number 20210333319
- Publication date Oct 28, 2021
- TOKYO ELECTRON LIMITED
- Kentaro KONISHI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE INSPECTION METHOD
- Publication number 20200174073
- Publication date Jun 4, 2020
- Tetsuya KAGAMI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM, WAFER MAP DISPLAY, WAFER MAP DISPLAY METHOD, AND...
- Publication number 20200064398
- Publication date Feb 27, 2020
- Shin UCHIDA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20200011925
- Publication date Jan 9, 2020
- Tetsuya KAGAMI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND MALFUNCTION ANALYSIS/PREDICTION METHOD FOR IN...
- Publication number 20200011927
- Publication date Jan 9, 2020
- Tetsuya KAGAMI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE INSPECTION METHOD, PROBE CARD, INTERPOSER, AND INSPECTION AP...
- Publication number 20170256324
- Publication date Sep 7, 2017
- TOKYO ELECTRON LIMITED
- Tetsuya KAGAMI
- G01 - MEASURING TESTING