Tetsuya KANEKO

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Kobe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample analyzer and sample analyzing method
- Patent number 10,261,072
- Issue date Apr 16, 2019
- Sysmex Corporation
- Shota Tateyama
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing apparatus and method for controlling a sample pro...
- Patent number 9,164,110
- Issue date Oct 20, 2015
- Sysmex Corporation
- Daigo Fukuma
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DISPLAY METHOD AND SPECIMEN ANALYSIS DEVICE
- Publication number 20250014243
- Publication date Jan 9, 2025
- SYSMEX CORPORATION
- Yuji Masuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANAGEMENT METHOD
- Publication number 20240428933
- Publication date Dec 26, 2024
- SYSMEX CORPORATION
- Takashi YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY METHOD AND SPECIMEN ANALYSIS DEVICE
- Publication number 20220277500
- Publication date Sep 1, 2022
- SYSMEX CORPORATION
- Yuji Masuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD
- Publication number 20160061821
- Publication date Mar 3, 2016
- SYSMEX CORPORATION
- Shota TATEYAMA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS AND METHOD FOR CONTROLLING A SAMPLE PRO...
- Publication number 20130160533
- Publication date Jun 27, 2013
- SYSMEX CORPORATION
- Daigo FUKUMA
- G01 - MEASURING TESTING