Tetsuya Katou

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device having a lower-layer line
- Patent number 8,445,987
- Issue date May 21, 2013
- Renesas Electronics Corporation
- Tetsuya Katou
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device and inspection method therefor
- Patent number 8,334,201
- Issue date Dec 18, 2012
- Renesas Electronics Corporation
- Tetsuya Katou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including offset bonding pad and inspection me...
- Patent number 8,264,090
- Issue date Sep 11, 2012
- Renesas Electronics Corporation
- Tetsuya Katou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD analysis device and ESD analysis program used for designing sem...
- Patent number 8,230,373
- Issue date Jul 24, 2012
- Renesas Electronics Corporation
- Susumu Kobayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and control method of switch transistor thereof
- Patent number 8,198,751
- Issue date Jun 12, 2012
- Renesas Electronics Corporation
- Tetsuya Katou
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor device with less power supply noise
- Patent number 8,067,790
- Issue date Nov 29, 2011
- Renesas Electronics Corporation
- Tetsuya Katou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including power supply pad and trunk wiring wh...
- Patent number 7,960,824
- Issue date Jun 14, 2011
- Renesas Electronics Corporation
- Tetsuya Katou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD analysis device and ESD analysis program used for designing sem...
- Patent number 7,853,909
- Issue date Dec 14, 2010
- Renesas Electronics Corporation
- Susumu Kobayashi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE WITH LESS POWER SUPPLY NOISE
- Publication number 20120037959
- Publication date Feb 16, 2012
- RENESAS ELECTRONICS CORPORATION
- Tetsuya Katou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and inspection method therefor
- Publication number 20110129993
- Publication date Jun 2, 2011
- RENESAS ELECTRONICS CORPORATION
- Tetsuya Katou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD ANALYSIS DEVICE AND ESD ANALYSIS PROGRAM USED FOR DESIGNING SEM...
- Publication number 20110022376
- Publication date Jan 27, 2011
- NEC Electronics Corporation
- Susumu Kobayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND CONTROL METHOD OF SWITCH TRANSISTOR THEREOF
- Publication number 20100164598
- Publication date Jul 1, 2010
- NEC ELECTRONICS CORPORATION
- Tetsuya KATOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device including power supply pad and trunk wiring wh...
- Publication number 20100072625
- Publication date Mar 25, 2010
- NEC Electronics Corporation
- Tetsuya KATOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20090295463
- Publication date Dec 3, 2009
- NEC Electronics Corporation
- Tetsuya KATOU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor device and inspection method therefor
- Publication number 20090273064
- Publication date Nov 5, 2009
- NEC Electronics Corporation
- Tetsuya KATOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH LESS POWER SUPPLY NOISE
- Publication number 20090140309
- Publication date Jun 4, 2009
- NEC ELECTRONICS CORPORATION
- Tetsuya KATOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD analysis device and ESD analysis program used for designing sem...
- Publication number 20080104554
- Publication date May 1, 2008
- NEC Electronics Corporation
- Susumu Kobayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Integrated circuit verification method, verification apparatus, and...
- Publication number 20060117283
- Publication date Jun 1, 2006
- NEC Electronics Corporation
- Tetsuya Katou
- G06 - COMPUTING CALCULATING COUNTING

Tetsuya Katou

Person

Patents Grantslast 30 patents

Semiconductor device having a lower-layer line

Semiconductor device and inspection method therefor

Semiconductor device including offset bonding pad and inspection me...

ESD analysis device and ESD analysis program used for designing sem...

Semiconductor device and control method of switch transistor thereof

Semiconductor device with less power supply noise

Semiconductor device including power supply pad and trunk wiring wh...

ESD analysis device and ESD analysis program used for designing sem...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE WITH LESS POWER SUPPLY NOISE

Semiconductor device and inspection method therefor

ESD ANALYSIS DEVICE AND ESD ANALYSIS PROGRAM USED FOR DESIGNING SEM...

SEMICONDUCTOR DEVICE AND CONTROL METHOD OF SWITCH TRANSISTOR THEREOF

Semiconductor device including power supply pad and trunk wiring wh...

SEMICONDUCTOR DEVICE

Semiconductor device and inspection method therefor

SEMICONDUCTOR DEVICE WITH LESS POWER SUPPLY NOISE

ESD analysis device and ESD analysis program used for designing sem...

Integrated circuit verification method, verification apparatus, and...