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Tetsuya Kimijima
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Tsuchiura-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Gas purifying process and device
Patent number
8,597,584
Issue date
Dec 3, 2013
Taiyo Nippon Sanso Corporation
Tadahiro Ohmi
C01 - INORGANIC CHEMISTRY
Information
Patent Grant
Gas purifying process and device
Patent number
7,744,836
Issue date
Jun 29, 2010
Taiyo Nippon Sanso Corporation
Tadahiro Ohmi
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Method and apparatus for measuring concentrations of components of...
Patent number
6,857,324
Issue date
Feb 22, 2005
Nippon Sanso Corporation
Tetsuya Sato
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring concentrations of components of...
Patent number
6,823,743
Issue date
Nov 30, 2004
Nippon Sanso Corporation
Tetsuya Sato
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring nitrogen in a gas
Patent number
6,717,666
Issue date
Apr 6, 2004
Nippon Sanso Corporation
Tetsuya Satou
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for collecting rare gas
Patent number
6,605,134
Issue date
Aug 12, 2003
Nippon Sanso Corporation
Yoshio Ishihara
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Gas analyzing apparatus
Patent number
6,550,308
Issue date
Apr 22, 2003
Nippon Sanso Corporation
Tsutomu Kikuchi
G01 - MEASURING TESTING
Information
Patent Grant
Gas supplying apparatus and gas substitution method
Patent number
6,478,040
Issue date
Nov 12, 2002
Nippon Sanso Corporation
Tsutomu Kikuchi
F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information
Patent Grant
System for analyzing trace amounts of impurities in gases
Patent number
6,418,781
Issue date
Jul 16, 2002
Nippon Sanso Corporation
Akira Nishina
G01 - MEASURING TESTING
Information
Patent Grant
Gas analyzing apparatus
Patent number
6,397,660
Issue date
Jun 4, 2002
Nippon Sanso Corporation
Tsutomu Kikuchi
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for treating exhaust gas
Patent number
6,375,911
Issue date
Apr 23, 2002
Nippon Sanso Corporation
Tadahiro Ohmi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Multi-gas analysis system for analyzing high-purity gases
Patent number
6,324,892
Issue date
Dec 4, 2001
Nippon Sanso Corporation
Akira Nishina
G01 - MEASURING TESTING
Information
Patent Grant
Analysis method for gases and apparatus therefor
Patent number
6,040,915
Issue date
Mar 21, 2000
Nippon Sanso Corporation
Shang-Qian Wu
G01 - MEASURING TESTING
Information
Patent Grant
Method for analyzing impurities in gas and its analyzer
Patent number
6,000,275
Issue date
Dec 14, 1999
Nippon Sanso Corporation
Akira Nishina
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Gas purifying process and device
Publication number
20100247395
Publication date
Sep 30, 2010
Taiyo Nippon Sanso Corporation
Tadahiro Ohmi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Gas Purifying Process and Device
Publication number
20060165573
Publication date
Jul 27, 2006
Taiyo Nippon Sanso Corporation
Tadahiro Ohmi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Method and apparatus for measuring concentrations of components of...
Publication number
20030172723
Publication date
Sep 18, 2003
Tetsuya Sato
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measuring concentrations of components of...
Publication number
20030046983
Publication date
Mar 13, 2003
Tetsuya Sato
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for producing gas containing metal particles a...
Publication number
20020144535
Publication date
Oct 10, 2002
Susumu Sakata
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measuring nitrogen in a gas
Publication number
20020140932
Publication date
Oct 3, 2002
Tetsuya Satou
G01 - MEASURING TESTING
Information
Patent Application
Gas analyzing apparatus
Publication number
20020108429
Publication date
Aug 15, 2002
NIPPON SANSO CORPORATION
Tsutomu Kikuchi
G01 - MEASURING TESTING
Information
Patent Application
System and process for analysis
Publication number
20020111747
Publication date
Aug 15, 2002
Akira Nishina
G01 - MEASURING TESTING
Information
Patent Application
GAS ANALYZING APPARATUS
Publication number
20020062680
Publication date
May 30, 2002
Nippon Sanso Corporation
Tsutomu Kikuchi
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for collecting rare gas
Publication number
20020035921
Publication date
Mar 28, 2002
Nippon Sanso Corporation
Yoshio Ishihara
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL