Tetsuya Kobayashi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Non-destructive inspection method and device
- Patent number 9,255,899
- Issue date Feb 9, 2016
- IHI Corporation
- Hiroyuki Nose
- G01 - MEASURING TESTING
Information Patent Grant
Personal digital assistant, and display control method and display...
- Patent number 8,928,552
- Issue date Jan 6, 2015
- Sony Corporation
- Tatsuhito Aono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-destructive inspection method and device
- Patent number 8,680,477
- Issue date Mar 25, 2014
- IHI Corporation
- Hiroyuki Nose
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NON-DESTRUCTIVE INSPECTION METHOD AND DEVICE
- Publication number 20120199754
- Publication date Aug 9, 2012
- IHI Corporation
- Hiroyuki Nose
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE INSPECTION METHOD AND DEVICE
- Publication number 20120199746
- Publication date Aug 9, 2012
- IHI Corporation
- Hiroyuki Nose
- G01 - MEASURING TESTING
Information Patent Application
PERSONAL DIGITAL ASSISTANT, AND DISPLAY CONTROL METHOD AND DISPLAY...
- Publication number 20120139815
- Publication date Jun 7, 2012
- SONY ERICSSON MOBILE COMMUNICATIONS JAPAN, INC.
- Tatsuhito AONO
- G06 - COMPUTING CALCULATING COUNTING