Tetsuya KUITANI

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer for testing and a test system
- Patent number 9,684,053
- Issue date Jun 20, 2017
- Advantest Corporation
- Tetsuya Kuitani
- G01 - MEASURING TESTING
Information Patent Grant
Contactor, contact structure, probe card, and test apparatus
- Patent number 8,241,929
- Issue date Aug 14, 2012
- Advantest Corporation
- Tetsuya Kuitani
- G01 - MEASURING TESTING
Information Patent Grant
Method of production of a contact structure
- Patent number 8,097,475
- Issue date Jan 17, 2012
- Advantest Corporation
- Tetsuya Kuitani
- G01 - MEASURING TESTING
Information Patent Grant
Contactor, contact structure provided with contactors, probe card,...
- Patent number 7,764,152
- Issue date Jul 27, 2010
- Advantest Corporation
- Tetsuya Kuitani
- G01 - MEASURING TESTING
Information Patent Grant
Contact terminal for measurement, measurement apparatus, probe card...
- Patent number 7,474,109
- Issue date Jan 6, 2009
- Advantest Corporation
- Tetsuya Kuitani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER FOR TESTING AND A TEST SYSTEM
- Publication number 20150268275
- Publication date Sep 24, 2015
- Advantest Corporation
- Tetsuya KUITANI
- G01 - MEASURING TESTING
Information Patent Application
PROBE, PROBE CARD AND ELECTRONIC DEVICE TESTING APPARATUS
- Publication number 20120133383
- Publication date May 31, 2012
- Advantest Corporation
- Tetsuya Kuitani
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR, CONTACT STRUCTURE, PROBE CARD, AND TEST APPARATUS
- Publication number 20120112781
- Publication date May 10, 2012
- Advantest Corporation
- Tetsuya KUITANI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PRODUCTION OF A CONTACT STRUCTURE
- Publication number 20100304559
- Publication date Dec 2, 2010
- Advantest Corporation
- Tetsuya KUITANI
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR, CONTACT STRUCTURE PROVIDED WITH CONTACTORS, PROBE CARD,...
- Publication number 20070013390
- Publication date Jan 18, 2007
- Advantest Corporation
- Tetsuya KUITANI
- G01 - MEASURING TESTING
Information Patent Application
Contact terminal for measurement, measurement apparatus, probe card...
- Publication number 20060279304
- Publication date Dec 14, 2006
- Advantest Corporation
- Tetsuya Kuitani
- G01 - MEASURING TESTING