Tetsuya Matsui

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Ultrasonic inspection system
- Patent number 11,473,908
- Issue date Oct 18, 2022
- Hitachi-GE Nuclear Energy, Ltd.
- Akinori Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic inspection system
- Patent number 11,002,709
- Issue date May 11, 2021
- Hitachi-GE Nuclear Energy, Ltd.
- Akinori Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for monitoring status of turbine blades
- Patent number 9,689,660
- Issue date Jun 27, 2017
- Mitsubishi Hitachi Power Systems, Ltd.
- Akira Nishimizu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Internal defect inspection method and apparatus for the same
- Patent number 9,134,279
- Issue date Sep 15, 2015
- Hitachi, Ltd.
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Distance measuring device and distance measuring method
- Patent number 8,982,332
- Issue date Mar 17, 2015
- Hitachi, Ltd.
- Takehiro Tachizaki
- G01 - MEASURING TESTING
Information Patent Grant
Dark-field defect inspecting method, dark-field defect inspecting a...
- Patent number 8,681,328
- Issue date Mar 25, 2014
- Hitachi High-Technologies Corporation
- Atsushi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever for magnetic force microscope and method of manufacturin...
- Patent number 8,621,659
- Issue date Dec 31, 2013
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Residual stress measuring method and system
- Patent number 7,884,924
- Issue date Feb 8, 2011
- Hitachi, Ltd.
- Shohei Numata
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current testing apparatus and eddy current testing method
- Patent number 7,872,472
- Issue date Jan 18, 2011
- Hitachi, Ltd.
- Yutaka Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic testing apparatus for turbine forks and method thereof
- Patent number 7,841,237
- Issue date Nov 30, 2010
- Hitachi, Ltd.
- Yutaka Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current testing method
- Patent number 7,772,840
- Issue date Aug 10, 2010
- Hitachi, Ltd.
- Yutaka Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Chemical substance total management system, storage medium storing...
- Patent number 7,536,239
- Issue date May 19, 2009
- Hitachi, Ltd.
- Yoshiaki Ichikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chemical substance total management system, storage medium storing...
- Patent number 7,532,946
- Issue date May 12, 2009
- Hitachi, Ltd.
- Yoshiaki Ichikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chemical substance total management system, storage medium storing...
- Patent number 7,433,757
- Issue date Oct 7, 2008
- Hitachi, Ltd.
- Yoshiaki Ichikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chemical substance total management system, storage medium storing...
- Patent number 7,272,465
- Issue date Sep 18, 2007
- Hitachi, Ltd.
- Yoshiaki Ichikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Eddy current testing probe and eddy current testing apparatus
- Patent number 7,235,967
- Issue date Jun 26, 2007
- Hitachi, Ltd.
- Akira Nishimizu
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive inspection apparatus and nondestructive inspection m...
- Patent number 7,171,854
- Issue date Feb 6, 2007
- Hitachi, Ltd.
- Yoshiaki Nagashima
- G01 - MEASURING TESTING
Information Patent Grant
Radioactive gas measurement apparatus and failed fuel detection system
- Patent number 7,151,262
- Issue date Dec 19, 2006
- Hitachi, Ltd.
- Hiroshi Kitaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic flaw detecting method and ultrasonic flaw detector
- Patent number 7,093,490
- Issue date Aug 22, 2006
- Hitachi, Ltd.
- Naoyuki Kono
- G01 - MEASURING TESTING
Information Patent Grant
Chemical material integrated management system and method thereof
- Patent number 7,092,960
- Issue date Aug 15, 2006
- Hitachi, Ltd.
- Satoshi Ohishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chemical substance total management system, storage medium storing...
- Patent number 6,980,883
- Issue date Dec 27, 2005
- Hitachi, Ltd.
- Yoshiaki Ichikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ultrasonic array sensor, ultrasonic inspection instrument and ultra...
- Patent number 6,957,583
- Issue date Oct 25, 2005
- Hitachi, Ltd.
- Masahiro Tooma
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Grant
Method and system for comprehensive management of chemical materials
- Patent number 6,934,640
- Issue date Aug 23, 2005
- Hitachi, Ltd.
- Yoshiaki Ichikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic exposure dose meter and radiation handling operation man...
- Patent number 6,891,476
- Issue date May 10, 2005
- Hitachi, Ltd.
- Hiroshi Kitaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Chemical substance total management system, storage medium storing...
- Patent number 6,778,877
- Issue date Aug 17, 2004
- Hitachi, Ltd.
- Yoshiaki Ichikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle measuring device and measuring method thereof
- Patent number 6,774,638
- Issue date Aug 10, 2004
- Hitachi, Ltd.
- Nobuyoshi Kogawa
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle measuring device and measuring method thereof
- Patent number 6,639,392
- Issue date Oct 28, 2003
- Hitachi, Ltd.
- Nobuyoshi Kogawa
- G01 - MEASURING TESTING
Information Patent Grant
Laser plasma x-ray source, semiconductor lithography apparatus usin...
- Patent number 5,991,360
- Issue date Nov 23, 1999
- Hitachi, Ltd.
- Tetsuya Matsui
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Plant diagnosis apparatus and method
- Patent number 5,369,674
- Issue date Nov 29, 1994
- Hitachi, Ltd.
- Kenji Yokose
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatus for analysis of particulate material, analytical method f...
- Patent number 5,316,983
- Issue date May 31, 1994
- Hitachi, Ltd.
- Haruo Fujimori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LAGGING MATERIAL
- Publication number 20210327625
- Publication date Oct 21, 2021
- HITACHI-GE NUCLEAR ENERGY, LTD.
- Akinori TAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ultrasonic Inspection System
- Publication number 20190383604
- Publication date Dec 19, 2019
- Hitachi-GE NUCLEAR ENERGY, LTD.
- Akinori TAMURA
- G01 - MEASURING TESTING
Information Patent Application
Ultrasonic Inspection System
- Publication number 20190195830
- Publication date Jun 27, 2019
- Hitachi-GE NUCLEAR ENERGY, LTD.
- Akinori TAMURA
- G01 - MEASURING TESTING
Information Patent Application
LAGGING MATERIAL
- Publication number 20180356369
- Publication date Dec 13, 2018
- HITACHI-GE NUCLEAR ENERGY, LTD.
- Akinori TAMURA
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Monitoring Status of Turbine Blades
- Publication number 20150002143
- Publication date Jan 1, 2015
- Mitsubishi Hitachi Power Systems, Ltd.
- Akira NISHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
INTERNAL DEFECT INSPECTION METHOD AND APPARATUS FOR THE SAME
- Publication number 20130160552
- Publication date Jun 27, 2013
- Hitachi, Ltd
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
Distance Measuring Device and Distance Measuring Method
- Publication number 20130003038
- Publication date Jan 3, 2013
- Hitachi, Ltd
- Takehiro Tachizaki
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...
- Publication number 20120291161
- Publication date Nov 15, 2012
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
DARK-FIELD DEFECT INSPECTING METHOD, DARK-FIELD DEFECT INSPECTING A...
- Publication number 20110286001
- Publication date Nov 24, 2011
- Atsushi Taniguchi
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT TESTING APPARATUS AND EDDY CURRENT TESTING METHOD
- Publication number 20100085042
- Publication date Apr 8, 2010
- Hitachi, Ltd
- Yutaka Suzuki
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT TESTING APPARATUS AND EDDY CURRENT TESTING METHOD
- Publication number 20100085043
- Publication date Apr 8, 2010
- Hitachi, Ltd
- Yutaka Suzuki
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC TESTING APPARATUS FOR TURBINE FORKS AND METHOD THEREOF
- Publication number 20090120192
- Publication date May 14, 2009
- Yutaka Suzuki
- G01 - MEASURING TESTING
Information Patent Application
RESIDUAL STRESS MEASURING METHOD AND SYSTEM
- Publication number 20080123079
- Publication date May 29, 2008
- Shohei NUMATA
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT TESTING APPARATUS AND EDDY CURRENT TESTING METHOD
- Publication number 20080079426
- Publication date Apr 3, 2008
- Yutaka Suzuki
- G01 - MEASURING TESTING
Information Patent Application
Chemical substance total management system, storage medium storing...
- Publication number 20080040148
- Publication date Feb 14, 2008
- Yoshiaki Ichikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Chemical substance total management system, storage medium storing...
- Publication number 20080015732
- Publication date Jan 17, 2008
- Yoshiaki Ichikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Chemical substance total management system, storage medium storing...
- Publication number 20080015731
- Publication date Jan 17, 2008
- Yoshiaki Ichikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for comprehensive management of chemical materials
- Publication number 20070061044
- Publication date Mar 15, 2007
- Akira Sekine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIOACTIVE GAS MEASUREMENT APPARATUS AND FAILED FUEL DETECTION SYSTEM
- Publication number 20060278828
- Publication date Dec 14, 2006
- Hiroshi Kitaguchi
- G01 - MEASURING TESTING
Information Patent Application
Eddy current testing probe and eddy current testing apparatus
- Publication number 20060170420
- Publication date Aug 3, 2006
- Akira Nishimizu
- G01 - MEASURING TESTING
Information Patent Application
Chemical substance total management system, storage medium storing...
- Publication number 20060015212
- Publication date Jan 19, 2006
- Yoshiaki Ichikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Ultrasonic flaw detecting method and ultrasonic flaw detector
- Publication number 20050183505
- Publication date Aug 25, 2005
- Naoyuki Kono
- G01 - MEASURING TESTING
Information Patent Application
Nondestructive inspection apparatus and nondestructive inspection m...
- Publication number 20040255678
- Publication date Dec 23, 2004
- Yoshiaki Nagashima
- G01 - MEASURING TESTING
Information Patent Application
Chemical substance total management system, storage medium storing...
- Publication number 20040260627
- Publication date Dec 23, 2004
- Yoshiaki Ichikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Ultrasonic array sensor, ultrasonic inspection instrument and ultra...
- Publication number 20040118210
- Publication date Jun 24, 2004
- Masahiro Tooma
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Application
Charged particle measuring device and measuring method thereof
- Publication number 20030146760
- Publication date Aug 7, 2003
- Hitachi, Ltd.
- Nobuyoshi Kogawa
- G01 - MEASURING TESTING
Information Patent Application
Charged particle measuring device and measuring method thereof
- Publication number 20030030444
- Publication date Feb 13, 2003
- Hitachi, Ltd.
- Nobuyoshi Kogawa
- G01 - MEASURING TESTING
Information Patent Application
Electronic exposure dose meter and radiation handling operation man...
- Publication number 20020195572
- Publication date Dec 26, 2002
- Hiroshi Kitaguchi
- G01 - MEASURING TESTING
Information Patent Application
Electronic exposure dose meter and radiation handling operation man...
- Publication number 20020180606
- Publication date Dec 5, 2002
- Hitachi, Ltd.
- Hiroshi Kitaguchi
- G01 - MEASURING TESTING
Information Patent Application
Environmental performance improvement support system and environmen...
- Publication number 20020133302
- Publication date Sep 19, 2002
- Hitachi, Ltd.
- Tetsuya Matsui
- G06 - COMPUTING CALCULATING COUNTING

Tetsuya Matsui

Person

Patents Grantslast 30 patents

Ultrasonic inspection system

Ultrasonic inspection system

Method and device for monitoring status of turbine blades

Internal defect inspection method and apparatus for the same

Distance measuring device and distance measuring method

Dark-field defect inspecting method, dark-field defect inspecting a...

Cantilever for magnetic force microscope and method of manufacturin...

Residual stress measuring method and system

Eddy current testing apparatus and eddy current testing method

Ultrasonic testing apparatus for turbine forks and method thereof

Eddy current testing method

Chemical substance total management system, storage medium storing...

Chemical substance total management system, storage medium storing...

Chemical substance total management system, storage medium storing...

Chemical substance total management system, storage medium storing...

Eddy current testing probe and eddy current testing apparatus

Nondestructive inspection apparatus and nondestructive inspection m...

Radioactive gas measurement apparatus and failed fuel detection system

Ultrasonic flaw detecting method and ultrasonic flaw detector

Chemical material integrated management system and method thereof

Chemical substance total management system, storage medium storing...

Ultrasonic array sensor, ultrasonic inspection instrument and ultra...

Method and system for comprehensive management of chemical materials

Electronic exposure dose meter and radiation handling operation man...

Chemical substance total management system, storage medium storing...

Charged particle measuring device and measuring method thereof

Charged particle measuring device and measuring method thereof

Laser plasma x-ray source, semiconductor lithography apparatus usin...

Plant diagnosis apparatus and method

Apparatus for analysis of particulate material, analytical method f...

Patents Applicationslast 30 patents

LAGGING MATERIAL

Ultrasonic Inspection System

Ultrasonic Inspection System

LAGGING MATERIAL

Method and Device for Monitoring Status of Turbine Blades

INTERNAL DEFECT INSPECTION METHOD AND APPARATUS FOR THE SAME

Distance Measuring Device and Distance Measuring Method

CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...

DARK-FIELD DEFECT INSPECTING METHOD, DARK-FIELD DEFECT INSPECTING A...

EDDY CURRENT TESTING APPARATUS AND EDDY CURRENT TESTING METHOD

EDDY CURRENT TESTING APPARATUS AND EDDY CURRENT TESTING METHOD

ULTRASONIC TESTING APPARATUS FOR TURBINE FORKS AND METHOD THEREOF

RESIDUAL STRESS MEASURING METHOD AND SYSTEM

EDDY CURRENT TESTING APPARATUS AND EDDY CURRENT TESTING METHOD

Chemical substance total management system, storage medium storing...

Chemical substance total management system, storage medium storing...

Chemical substance total management system, storage medium storing...

Method and system for comprehensive management of chemical materials

RADIOACTIVE GAS MEASUREMENT APPARATUS AND FAILED FUEL DETECTION SYSTEM

Eddy current testing probe and eddy current testing apparatus

Chemical substance total management system, storage medium storing...

Ultrasonic flaw detecting method and ultrasonic flaw detector

Nondestructive inspection apparatus and nondestructive inspection m...

Chemical substance total management system, storage medium storing...

Ultrasonic array sensor, ultrasonic inspection instrument and ultra...

Charged particle measuring device and measuring method thereof

Charged particle measuring device and measuring method thereof

Electronic exposure dose meter and radiation handling operation man...

Electronic exposure dose meter and radiation handling operation man...

Environmental performance improvement support system and environmen...