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last 30 patents
Information
Patent Grant
Optical measurement apparatus and method for optical measurement
Patent number
6,960,771
Issue date
Nov 1, 2005
Hamamatsu Photonics K.K.
Motohiro Suyama
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement apparatus and method for optical measurement
Patent number
6,940,589
Issue date
Sep 6, 2005
Hamamatsu Photonics K.K.
Motohiro Suyama
G01 - MEASURING TESTING
Information
Patent Grant
Light receiving module and radiation detecting apparatus equipped w...
Patent number
6,545,256
Issue date
Apr 8, 2003
Hamamatsu Photonics K.K.
Tomohiro Ishizu
G01 - MEASURING TESTING
Information
Patent Grant
Electron tube having a photoelectron confining mechanism
Patent number
6,297,489
Issue date
Oct 2, 2001
Hamamatsu Photonics K.K.
Motohiro Suyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron tube
Patent number
6,198,221
Issue date
Mar 6, 2001
Hamamatsu Photonics K.K.
Motohiro Suyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron tube with electron lens
Patent number
5,917,282
Issue date
Jun 29, 1999
Hamamatsu Photonics K.K.
Motohiro Suyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron tube
Patent number
5,883,466
Issue date
Mar 16, 1999
Hamamatsu Photonics K.K.
Motohiro Suyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron tube having a photoelectron confining mechanism
Patent number
5,874,728
Issue date
Feb 23, 1999
Hamamatsu Photonics K.K.
Motohiro Suyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Resistor assembly and electron multiplier using the same
Patent number
5,677,595
Issue date
Oct 14, 1997
Hamamatsu Photonics K.K.
Shirou Sakai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron multiplying device having multiple dynode stages encased b...
Patent number
5,446,275
Issue date
Aug 29, 1995
Hamamatsu Photonics K.K.
Shiro Sakai
H01 - BASIC ELECTRIC ELEMENTS