Tetsuya NIIBORI

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Mito, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and vibration damper for charged pa...
- Patent number 10,056,226
- Issue date Aug 21, 2018
- Hitachi High-Technologies Corporation
- Motohiro Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical microscope device and testing apparatus comprising same
- Patent number 9,851,548
- Issue date Dec 26, 2017
- Hitachi High-Technologies Corporation
- Kei Shimura
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND VIBRATION DAMPER FOR CHARGED PA...
- Publication number 20170250054
- Publication date Aug 31, 2017
- Hitachi High-Technologies Corporation
- Motohiro TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL MICROSCOPE DEVICE AND TESTING APPARATUS COMPRISING SAME
- Publication number 20140210983
- Publication date Jul 31, 2014
- Hitachi High-Technologies Corporation
- Kei Shimura
- G02 - OPTICS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND METHOD FOR PREPARING SPECIMEN
- Publication number 20140084159
- Publication date Mar 27, 2014
- Hitachi High-Technologies Corporation
- Kaori Yaeshima
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130284924
- Publication date Oct 31, 2013
- Hitachi High-Technologies Corporation
- Masaki Mizuochi
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE OBSERVATION APPARATUS
- Publication number 20130167665
- Publication date Jul 4, 2013
- Hitachi High-Technologies Corporation
- Tetsuya NIIBORI
- G01 - MEASURING TESTING