Tetsuya Ozawa

Person

Hino-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Quantitative analysis apparatus, method and program and manufacturi...
- Patent number 12,174,131
- Issue date Dec 24, 2024
- Rigaku Corporation
- Takahiro Kuzumaki
- G01 - MEASURING TESTING
Information Patent Grant
Scattering measurement analysis method, scattering measurement anal...
- Patent number 12,175,173
- Issue date Dec 24, 2024
- Rigaku Corporation
- Tomoyuki Iwata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Airtight box for measurement, airtight apparatus, measurement syste...
- Patent number 11,942,231
- Issue date Mar 26, 2024
- Rigaku Corporation
- Koichiro Ito
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray analysis apparatus
- Patent number 11,215,571
- Issue date Jan 4, 2022
- Rigaku Corporation
- Takeshi Osakabe
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction apparatus
- Patent number 10,900,913
- Issue date Jan 26, 2021
- Rigaku Corporation
- Takeshi Osakabe
- G01 - MEASURING TESTING
Information Patent Grant
X-ray generator and x-ray analysis device
- Patent number 10,854,348
- Issue date Dec 1, 2020
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffractometer with multilayer reflection-type monochromator
- Patent number 10,436,723
- Issue date Oct 8, 2019
- Rigaku Corporation
- Takeshi Osakabe
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 9,618,461
- Issue date Apr 11, 2017
- Rigaku Corporation
- Takao Ohara
- G01 - MEASURING TESTING
Information Patent Grant
X-ray optical component device and X-ray analyzer
- Patent number 9,490,038
- Issue date Nov 8, 2016
- Rigaku Corporation
- Kenji Wakasaya
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray apparatus, method of using the same and X-ray irradiation method
- Patent number 9,336,917
- Issue date May 10, 2016
- Rigaku Corporation
- Tetsuya Ozawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray diffraction apparatus and X-ray diffraction measurement method
- Patent number 9,074,992
- Issue date Jul 7, 2015
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Grant
Airbag deployment controller and passenger protection device includ...
- Patent number 7,896,392
- Issue date Mar 1, 2011
- Calsonic Kansei Corporation
- Tohru Oowada
- B60 - VEHICLES IN GENERAL
Information Patent Grant
X-ray diffraction measuring apparatus having debye-scherrer optical...
- Patent number 7,860,217
- Issue date Dec 28, 2010
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam conditioning device and X-ray analysis apparatus
- Patent number 7,684,543
- Issue date Mar 23, 2010
- Rigaku Corporation
- Ryuji Matsuo
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Vehicle data recording device
- Patent number 7,558,656
- Issue date Jul 7, 2009
- Calsonic Kansei Corporation
- Tetsuya Ozawa
- G07 - CHECKING-DEVICES
Information Patent Grant
Diffraction condition simulation device, diffraction measurement sy...
- Patent number 7,337,098
- Issue date Feb 26, 2008
- Rigaku Corporation
- Ryouichi Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Data recording apparatus for vehicle
- Patent number 7,266,433
- Issue date Sep 4, 2007
- Calsonic Kansei Corporation
- Tetsuya Ozawa
- G07 - CHECKING-DEVICES
Information Patent Grant
Method of displaying dynamically scattering vector of X-ray diffrac...
- Patent number 7,120,227
- Issue date Oct 10, 2006
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of setting measuring range of reciprocal-space mapping
- Patent number 6,999,557
- Issue date Feb 14, 2006
- Rigaku Corporation
- Susumu Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent x-ray analyzing method and apprartus
- Patent number 6,385,281
- Issue date May 7, 2002
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RADIATION MEASUREMENT APPARATUS
- Publication number 20240167968
- Publication date May 23, 2024
- Rigaku Corporation
- Takuya KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION AMOUNT SPECIFYING APPARATUS, METHOD, PROGRAM, AND JIG
- Publication number 20230152248
- Publication date May 18, 2023
- Rigaku Corporation
- Takuya KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
CONTROL APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20230115151
- Publication date Apr 13, 2023
- Rigaku Corporation
- Takuto SAKUMURA
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE ANALYSIS APPARATUS, METHOD AND PROGRAM AND MANUFACTURI...
- Publication number 20220390394
- Publication date Dec 8, 2022
- Rigaku Corporation
- Takahiro KUZUMAKI
- G01 - MEASURING TESTING
Information Patent Application
Scattering Measurement Analysis Method, Scattering Measurement Anal...
- Publication number 20210200922
- Publication date Jul 1, 2021
- Rigaku Corporation
- Tomoyuki IWATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AIRTIGHT BOX FOR MEASUREMENT, AIRTIGHT APPARATUS, MEASUREMENT SYSTE...
- Publication number 20210166829
- Publication date Jun 3, 2021
- Rigaku Corporation
- Koichiro Ito
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20200300789
- Publication date Sep 24, 2020
- Rigaku Corporation
- Takeshi OSAKABE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY GENERATOR AND X-RAY ANALYSIS DEVICE
- Publication number 20190272929
- Publication date Sep 5, 2019
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION APPARATUS
- Publication number 20180052121
- Publication date Feb 22, 2018
- Rigaku Corporation
- Takeshi Osakabe
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTOMETER
- Publication number 20170191950
- Publication date Jul 6, 2017
- Rigaku Corporation
- Takeshi OSAKABE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY OPTICAL COMPONENT DEVICE AND X-RAY ANALYZER
- Publication number 20150098547
- Publication date Apr 9, 2015
- Rigaku Corporation
- Kenji Wakasaya
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20140105368
- Publication date Apr 17, 2014
- Rigaku Corporation
- Takao OHARA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTION MEASUREMENT METHOD
- Publication number 20120140890
- Publication date Jun 7, 2012
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Application
X-RAY APPARATUS, METHOD OF USING THE SAME AND X-RAY IRRADIATION METHOD
- Publication number 20110268252
- Publication date Nov 3, 2011
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Application
Airbag deployment controller and passenger protection device includ...
- Publication number 20090167005
- Publication date Jul 2, 2009
- CALSONIC KANSEI CORPORATION
- Tohru Oowada
- B60 - VEHICLES IN GENERAL
Information Patent Application
X-Ray Diffraction Measuring Apparatus Having Debye-Scherrer Optical...
- Publication number 20090086910
- Publication date Apr 2, 2009
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Application
DATA RECORDING APPARATUS FOR VEHICLE
- Publication number 20070050109
- Publication date Mar 1, 2007
- CALSONIC KANSEI CORPORATION
- Tetsuya Ozawa
- G07 - CHECKING-DEVICES
Information Patent Application
Vehicle data recording device
- Publication number 20070032930
- Publication date Feb 8, 2007
- CALSONIC KANSEI CORPORATION
- Tetsuya Ozawa
- G07 - CHECKING-DEVICES
Information Patent Application
X-ray beam conditioning device and X-ray analysis apparatus
- Publication number 20070003013
- Publication date Jan 4, 2007
- Rigaku Corporation
- Ryuji Matsuo
- G01 - MEASURING TESTING
Information Patent Application
Method of displaying dynamically scattering vector of X-ray diffrac...
- Publication number 20050002488
- Publication date Jan 6, 2005
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Application
Method of setting measuring range of reciprocal-space mapping
- Publication number 20040240611
- Publication date Dec 2, 2004
- Rigaku Corporation
- Susumu Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Diffraction condition simulation device, diffraction measurement sy...
- Publication number 20030009316
- Publication date Jan 9, 2003
- Ryouichi Yokoyama
- G01 - MEASURING TESTING

Tetsuya Ozawa

Person

Patents Grantslast 30 patents

Quantitative analysis apparatus, method and program and manufacturi...

Scattering measurement analysis method, scattering measurement anal...

Airtight box for measurement, airtight apparatus, measurement syste...

X-ray analysis apparatus

X-ray diffraction apparatus

X-ray generator and x-ray analysis device

X-ray diffractometer with multilayer reflection-type monochromator

X-ray analysis apparatus

X-ray optical component device and X-ray analyzer

X-ray apparatus, method of using the same and X-ray irradiation method

X-ray diffraction apparatus and X-ray diffraction measurement method

Airbag deployment controller and passenger protection device includ...

X-ray diffraction measuring apparatus having debye-scherrer optical...

X-ray beam conditioning device and X-ray analysis apparatus

Vehicle data recording device

Diffraction condition simulation device, diffraction measurement sy...

Data recording apparatus for vehicle

Method of displaying dynamically scattering vector of X-ray diffrac...

Method of setting measuring range of reciprocal-space mapping

Fluorescent x-ray analyzing method and apprartus

Patents Applicationslast 30 patents

RADIATION MEASUREMENT APPARATUS

CORRECTION AMOUNT SPECIFYING APPARATUS, METHOD, PROGRAM, AND JIG

CONTROL APPARATUS, SYSTEM, METHOD, AND PROGRAM

QUANTITATIVE ANALYSIS APPARATUS, METHOD AND PROGRAM AND MANUFACTURI...

Scattering Measurement Analysis Method, Scattering Measurement Anal...

AIRTIGHT BOX FOR MEASUREMENT, AIRTIGHT APPARATUS, MEASUREMENT SYSTE...

X-RAY ANALYSIS APPARATUS

X-RAY GENERATOR AND X-RAY ANALYSIS DEVICE

X-RAY DIFFRACTION APPARATUS

X-RAY DIFFRACTOMETER

X-RAY OPTICAL COMPONENT DEVICE AND X-RAY ANALYZER

X-RAY ANALYSIS APPARATUS

X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTION MEASUREMENT METHOD

X-RAY APPARATUS, METHOD OF USING THE SAME AND X-RAY IRRADIATION METHOD

Airbag deployment controller and passenger protection device includ...

X-Ray Diffraction Measuring Apparatus Having Debye-Scherrer Optical...

DATA RECORDING APPARATUS FOR VEHICLE

Vehicle data recording device

X-ray beam conditioning device and X-ray analysis apparatus

Method of displaying dynamically scattering vector of X-ray diffrac...

Method of setting measuring range of reciprocal-space mapping

Diffraction condition simulation device, diffraction measurement sy...