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Tetsuya Satou
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for measuring nitrogen in a gas
Patent number
6,717,666
Issue date
Apr 6, 2004
Nippon Sanso Corporation
Tetsuya Satou
G01 - MEASURING TESTING
Information
Patent Grant
Method and an apparatus for analyzing trace impurities in gases
Patent number
6,653,144
Issue date
Nov 25, 2003
Nippon Sanso Corporation
Akira Nishina
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and process for supplying gas
Patent number
6,523,567
Issue date
Feb 25, 2003
Nippon Sanso Corporation
Tetsuya Satou
F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information
Patent Grant
Gas supplying apparatus and gas substitution method
Patent number
6,478,040
Issue date
Nov 12, 2002
Nippon Sanso Corporation
Tsutomu Kikuchi
F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information
Patent Grant
Method and apparatus for analyzing impurities in gases
Patent number
6,474,136
Issue date
Nov 5, 2002
Nippon Sanso Corporation
Akira Nishina
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PHOTOCHEMICAL REACTION DEVICE AND ISOTOPE ENRICHMENT METHOD USING T...
Publication number
20130327632
Publication date
Dec 12, 2013
Taiyo Nippon Sanso Corporation
Shigeru Hayashida
G02 - OPTICS
Information
Patent Application
Method and an apparatus for analyzing trace impurities in gases
Publication number
20030092193
Publication date
May 15, 2003
NIPPON SANSO CORPORATION
Akira Nishina
G01 - MEASURING TESTING
Information
Patent Application
Method and an apparatus for analyzing trace impurities in gases
Publication number
20030086826
Publication date
May 8, 2003
NIPPON SANSO CORPORATION
Akira Nishina
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measuring nitrogen in a gas
Publication number
20020140932
Publication date
Oct 3, 2002
Tetsuya Satou
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and process for supplying gas
Publication number
20020117222
Publication date
Aug 29, 2002
NIPPON SANSO CORPORATION
Tetsuya Satou
G01 - MEASURING TESTING