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Tetsuya YONEDA

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  • Kyoto-shi, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    X-RAY ANALYZER
    • Publication number 20240402101
    • Publication date Dec 5, 2024
    • Shimadzu Corporation
    • Tetsuya YONEDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    X-RAY FLUORESCENCE ANALYZER
    • Publication number 20230057233
    • Publication date Feb 23, 2023
    • Shimadzu Corporation
    • Takuro IZUMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    DISPERSIVE ELEMENT
    • Publication number 20220208408
    • Publication date Jun 30, 2022
    • Shimadzu Corporation
    • Takuro IZUMI
    • G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
  • Information Patent Application

    APPARATUS AND METHOD FOR ANALYZING CHEMICAL STATE OF BATTERY MATERIAL
    • Publication number 20200386696
    • Publication date Dec 10, 2020
    • Shimadzu Corporation
    • Kenji SATO
    • G01 - MEASURING TESTING
  • Information Patent Application

    X-RAY SPECTROMETER AND CHEMICAL STATE ANALYSIS METHOD USING THE SAME
    • Publication number 20200225173
    • Publication date Jul 16, 2020
    • SHIMADZU CORPORATION
    • Kenji SATO
    • G01 - MEASURING TESTING
  • Information Patent Application

    ANALYSIS DEVICE
    • Publication number 20190145918
    • Publication date May 16, 2019
    • Shimadzu Corporation
    • Tetsuya YONEDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    X-RAY ANALYZER
    • Publication number 20170097309
    • Publication date Apr 6, 2017
    • Shimadzu Corporation
    • Tetsuya YONEDA
    • G01 - MEASURING TESTING