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Teunis Both
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Wilnis, NL
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last 30 patents
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Patent Grant
Sensor and processing part for a sensor
Patent number
11,415,550
Issue date
Aug 16, 2022
YOKOGAWA PROCESS ANALYZERS EUROPE B.V.
Teunis Both
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for testing the integrity of an electrode in a...
Patent number
4,777,444
Issue date
Oct 11, 1988
Yokogawa Electric Corporation
Jozeph M. Beijk
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SENSOR AND PROCESSING PART FOR A SENSOR
Publication number
20200018725
Publication date
Jan 16, 2020
Yokogawa Process Analyzers Europe B.V.
Teunis Both
G01 - MEASURING TESTING