Teymour M. Mansour

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Configuration and testing of multiple-die integrated circuits
- Patent number 9,091,727
- Issue date Jul 28, 2015
- Xilinx, Inc.
- Julian Lupu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing programmable integrated circuits
- Patent number 8,082,535
- Issue date Dec 20, 2011
- Xilinx, Inc.
- Ian L. McEwen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for eliminating noise induced errors during te...
- Patent number 7,558,995
- Issue date Jul 7, 2009
- Xilinx, Inc.
- Randy J. Simmons
- G01 - MEASURING TESTING
Information Patent Grant
Methods of resource optimization in programmable logic devices to r...
- Patent number 6,944,809
- Issue date Sep 13, 2005
- Xilinx, Inc.
- Andrew W. Lai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Methods of resource optimization in programmable logic devices to r...
- Publication number 20040030975
- Publication date Feb 12, 2004
- Xilinx, Inc.
- Andrew W. Lai
- G06 - COMPUTING CALCULATING COUNTING